نتایج جستجو برای: ellipsometry

تعداد نتایج: 2054  

Journal: :International Journal of Nanotechnology 2007

Journal: :Microelectronics Journal 2004
F. Domínguez-Adame R. Hey V. Bellani G. B. Parravicini E. Diez

We characterized the electronic properties of ordered and intentionally disordered GaAs–AlxGa12xAs superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry in the near band-edge region. The spectra have been compared to the calculate electronic structure. The optical transitions in the various superlattices show specific features related to...

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