نتایج جستجو برای: built area

تعداد نتایج: 681886  

Journal: :Remote Sensing 2022

Built-up areas (BAs) information acquisition is essential to urban planning and sustainable development in the Greater Bay Area China. In this paper, a pseudo-Siamese dense convolutional network, namely PSDNet, proposed automatically extract BAs from spaceborne synthetic aperture radar (SAR) data Area, which considers spatial statistical features speckle SAR images. The local indicators of asso...

2005
Christopher Small Francesca Pozzi C. D. Elvidge

Previous studies of DMSP-OLS stable night lights have shown encouraging agreement between temporally stable lighted areas and various definitions of urban extent. However, these studies have also highlighted an inconsistent relationship between the actual lighted area and the boundaries of the urban areas considered. Applying detection frequency thresholds can reduce the spatial overextent of l...

2017
Justo García-Sanz-Calcedo Fernando López-Rodriguez Talal Yusaf

The aim of this paper is to quantity the annual average consumption of water in 13 public hospitals in Extremadura (Spain). An analytical study in order to reduce water demand was conducted from 2010 to 2014 in the above-mentioned hospitals. The study concluded that, in order to determine the average annual water consumption, a fixed ratio is not the appropriate tool. A parametric type related ...

Journal: :Remote Sensing 2018
Musa Tarawally Wenbo Xu Weiming Hou Terence Darlington Mushore

Urban growth and its associated expansion of built-up areas are expected to continue through to the twenty second century and at a faster pace in developing countries. This has the potential to increase thermal discomfort and heat-related distress. There is thus a need to monitor growth patterns, especially in resource constrained countries such as Africa, where few studies have so far been con...

Mashhad city is located on alluvial deposits where the expanded area of this city, especially the central and eastern areas surrounding Imam Reza holy shrine, are built on weak and fine-grained deposits. Therefore, the soil improvement would be inevitable due to construction of high-rise buildings such as hotels and commercial complexes in these areas, as well as restructuring old buildin...

2007
S. Wu

1. Introduction Logic Built-In Self-Test (BIST) schemes based on STUMPS structure use on-chip circuitry to generate test stimuli and analyze test responses, with little or no help from an ATE. The STUMPS (Self-Test Using a MISR and Parallel Shift register sequence generator) structure applies pseudo-random patterns generated by a PRPG (Pseudo-Random Pattern Generator) to a full-scan circuit in ...

2007
V. Gherman

Built-in self-test (BIST) is an attractive approach to detect delay faults because of its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique that has been successfully applied to stuck-at fault testing. As delay faults have lower random pattern testability than stuck-at faults, the need for DLBIST schemes has increased. However, an extension to delay fault test...

2003
Hamidreza Hashempour Fred J. Meyer Fabrizio Lombardi Farzin Karimi

This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisite testing process is analyzed using device-under-test (DUT) parameters (such as yield and average number of faults per DUT) as well as test process features (such as number of channels, coverage and touchdown time for...

2002
Miron Abramovici Charles E. Stroud

We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testi...

The demand of self-testing proportionally increases with memory size in System on Chip (SoC). SoC architecture normally occupies the majority of its area by memories. Due to increase in density of embedded memories, there is a need of self-testing mechanism in SoC design. Therefore, this research study focuses on this problem and introduces a smooth solution for self-testing.  In the proposed m...

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