نتایج جستجو برای: atomic force microscopy

تعداد نتایج: 425871  

2008
John H. Cantrell Sean A. Cantrell

An analytical model is developed of the interaction of the cantilever tip of an atomic force microscope with the sample surface that treats the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. To maintain equilibrium, the volume element is subjected to a restoring force from the remainder of t...

In this paper, the non-linear dynamic response of rectangular atomic force microscopy in tapping mode is considered. The effect of cantilever’s geometrical parameters (e.g., cantilever length, width, thickness, tip length and the angle between the cantilever and the sample's surface in liquid environment has been studied by taking into account the interaction forces. Results indicate that the r...

M. H. Korayem M. Taheri R. N. Hefzabad Hefzabad Z. Mahmoodi

The theory of contact mechanics deals with stresses and deformations which arise when the surfaces of two solid bodies are brought into contact. In elastic deformation contact occurs over a finite area. A regular method for determining the dimensions of this area is Hertz Contact Model. Appearance of atomic force microscope results in introduction of Contact ...

Journal: :Quarterly journal of experimental psychology 2008
Jeff Miller Rolf Ulrich

In three experiments we measured response time (RT) and peak force (PF) to investigate the grouping of left- and right-hand key press responses in a dual-task paradigm involving two independent go/no-go tasks. Within each task, a go stimulus within one of two modalities (i.e., visual versus auditory) required a response by one hand. In Experiment 1 with simultaneous go stimuli in the two tasks,...

Journal: :Physical review letters 2000
Ge Pu Zhang Rafailovich Sokolov Buenviaje Buckmaster Overney

We report results of glass transition (T(g)) measurements for polymer thin films using atomic force microscopy (AFM). The AFM mode, shear modulation force microscopy (SMFM), involves measuring the temperature-dependent shear force on a tip modulated parallel to the sample surface. Using this method we have measured the surface T(g) of thin (17-500 nm) polymer films and found that T(g) is indepe...

2012
Fabio L. Leite Carolina C. Bueno Alessandra L. Da Róz Ervino C. Ziemath Osvaldo N. Oliveira

The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS), it is now possible to measure...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2009
Victor C Hayden Luc Y Beaulieu

A numerical and experimental analysis of the optical beam deflection system used to monitor microcantilevers subjected to simultaneous deflection and twisting such as in lateral or frictional force microscopy was performed. This study focused on two optical beam deflection orientations where in the first case the optical beam and the detector are at a right angle to the length of the cantilever...

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