Contrast in the phase response of intermittent-contact atomic force microscopy (IC-AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This result is unexpected, as IC-AFM has previously only been considered as a probe of out-of-plane properties. Until now, AFM measurements of nanoscale in-plane properties have employed contact mode techniques. In-plane property me...

according to recent achievements in nano technology we can see its effects in different engineering fields. in nano manufacture process the first essential step is modeling coordinately in order to make it available different software are developing for this propose.  in this paper nano modeling for two papers is developed first understanding structure in nano and micro size and second simulati...

with the rise in the use of afm (atomic force microscope), we have witnessed a growing use of atomic microscope based nanorobots in the precise displacement of various particles. there are certain limitations to the application of nanorobots in the moving of nanoparticles. one of the most important of these limitations is the lack of an appropriate image feedback concurrent with the displaci...

The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during...

Fluid force microscopy combines the positional accuracy and force sensitivity of an atomic force microscope (AFM) with nanofluidics via a microchanneled cantilever. However, adequate loading and cleaning procedures for such AFM micropipettes are required for various application situations. Here, a new frontloading procedure is described for an AFM micropipette functioning as a force- and pressu...

Images and force measurements taken by an atomic-force microscope ( AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure u...

:هلاقم هصلاخ هداد حیضوت تیوضع عباوت ریداقم هلیسو هب تفج هب تفج هسیاقم هک ینامز یزاف یبتارم هلسلس لیلحترد اب یزافیراگزاس زا یفیرعت قیقحت نیا رد ،تسا هداس رایسب متسیس یراگزاس دروم رد ثحب،دوش یم ثعابو دنتسه رادروخرب یا هژیو تیمها زا یزاف یاه تبسن ،ًامازلا .دوش یم هئارا یراگزاس خرن نازیم یعضوم یاه تیولا تیوضع ریداقم اب یاه تیدودحم ناونع هب نینچمه ،دوش یم یراگزاسان خرن داجیا یدنب هبتر max-minیاه هعوم...

A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈ 100 K to room temperature. AFM operation above room temperature is also possibl...