At a Glance: This article describes a prototype of a discrete event simulator-Y4 (Yield Forecaster)-capable of simulating defect related yield loss as a function of time, for a multi-product IC manufacturing line. The methodology of estimating yield and cost is based on mimicking the operation and characteristics of a manufacturing line in the time domain. The effect of particles introduced dur...

We present an arbitrage-free, non-parametric yield curve prediction model which takes the full discretized yield curve data as input state variable. The absence of arbitrage is a particular important model feature for prediction models in case of highly correlated data as, e.g., for interest rates. Furthermore, the model structure allows to separate constructing the daily yield curve from estim...

The measurements of PbWO 4 crystal light yield associated to PIN diode with fast electronics have been made using an electrons and pions beam. Compared to the results obtained using the slow electronics, these new results are lower by a factor 1.5 to 2. The assumption is that this diierence is due to the scintillation slow contribution.

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As integrated circuit fabrication processes continue to increase in complexity, it has been determined that data collection, retention, and retrieval rates will continue to increase at an alarming rate. At future technology nodes, the time required to source manufacturing problems must at least remain constant to maintain anticipated productivity. Strategies and software methods for integrated ...

ion of manufacturing constraints into a set geometric of constraints or design rules for the layout designers to follow have traditionally been foundry’s main method to ensure high probability of correct fabrication of integrated circuits. Typical design rules are constraints on width, spacing or pattern density. Origins of design rules lie various manufacturing steps such as lithography, etch,...

Many mainstream languages have operators named yield that share common semantic roots but differ significantly in their details. We present the first known formal study of these mainstream yield operators, unify their many semantic differences, adapt them to to a functional setting, and distill the operational semantics and type theory for a generalized yield operator. The resultant yield, with...

Just as a traditional continuation represents the rest of a computation from a given point in the computation, a subcontinuation represents the rest of a subcomputation from a given point in the subcomputation. Subcontinuations are more expressive than traditional continuations and have been shown to be useful for controlling tree-structured concurrency, yet they have previously been implemente...

h EXCEPT FOR GETTING your chip to market on time, optimizing yield is perhaps the most important thing we can do to improve IC profitability. We address this problem in several ways: design for manufacturability (DFM) through layout rules, process control, and increasingly clean cleanrooms. In an ideal world, this would solve our yield problems. We know it doesn’t, so we build a diagnostic capa...