نتایج جستجو برای: x ray diffraction method

تعداد نتایج: 2226070  

2017
Zijian Xu Chunpeng Wang Haigang Liu Xulei Tao Renzhong Tai

Ptychography is a diffraction-based X-ray microscopy method that can image extended samples quantitatively while remove the resolution limit imposed by image-forming optical elements. As a natural extension of scanning transmission X-ray microscopy (STXM) imaging method, we developed soft X-ray ptychographic coherent diffraction imaging (PCDI) method at the STXM endstation of BL08U beamline of ...

2004
Atsushi Umeda Hajime Hirose

X-ray diffraction observation of metal fracture provides fracture analysis with useful information on the mechanics and mechanical conditions of fracturing. This method is called “X-ray Fractography” and has been developed especially in Japan as a new engineering tool for fracture analysis[1-3]. X-ray fractographic technique was applied to fracture surface of dental material. The relationship b...

Journal: :Physics and High Technology 2015

Journal: :international journal of nano dimension 0
b. sathyaseelan department of physics, university college of engineering arni (a constituent college of anna university chennai) arni 632 317, tamilnadu, india. s. sambasivam department of physics, pukyong national university, busan-608 737, south korea. t. alagesan department of physics, presidency college, chennai 600 005, tamil nadu, india. k. sivakumar department of physics, anna university, chennai-600025, tamilnadu, india.

nanocrystalline particles of cerium oxide (ceo2) have been prepared by the chemical precipitation method using cerium nitrate and urea with a molar ratio of 1:2. the results revealed that the formation of ceo2 fine particles is influenced by molar ratio of metal nitrates to fuel. well faceted ceo2 nanoparticles, were synthesized by thermal-assisted dissociation method at reflux temperature in a...

Journal: :Acta Crystallographica Section A Foundations and Advances 2015

Journal: :The European Physical Journal Special Topics 2012

Journal: :Seibutsu Butsuri 1967

2000
M. J. Bedzyk D. L. Marasco C. M. Foster D. T. Keane

An x-ray-diffraction method that directly senses the phase of the structure factor is demonstrated and used for determining the local polarity of thin ferroelectric films. This method is based on the excitation of an x-ray standing-wave field inside the film as a result of the interference between the strong incident x-ray wave and the weak kinematically Bragg-diffracted x-ray wave from the fil...

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