نتایج جستجو برای: vision metrology
تعداد نتایج: 132285 فیلتر نتایج به سال:
This work presents the experience of the National Laboratory for Ionizing Radiation Metrology (LNMRI) in the implementation of the requirements of the Mutual Recognition Arrangement (MRA) signed by 38 National Institutes of Metrology (NMI) in 1999. The degree of equivalence of activity reported by Bureau International des Poids et Mesures (BIPM) in the Key Comparison Data Base (KCDB), the main ...
The decrease in device dimensions is placing extremely tight constraints on many aspects of the CMP process. We outline four key areas that will provide significant steps toward attaining this level of control. In particular, we discuss the need for improved in-line surface topography metrology, and show that that high resolution profilometry appears to meet this need. We demonstrate the need f...
An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal p...
OBJECTIVE Analysing the fundamental methodological aspects which should be considered when drawing up calibration procedure for electro-medical equipment, thereby permitting international standard-based accreditation of electro-medical metrology laboratories in Colombia. METHODS NTC-ISO-IEC 17025:2005 and GTC-51-based procedures for calibrating electro-medical equipment were implemented and t...
Measurement based on international standards for measurement (i.e. metrology) is not the same as the judgment-based quantification of implicit relationships across a mix of entities and attributes without due consideration of admissible mathematical operations on numbers of different scale types. This paper analyzes the Measurement Information Model in ISO 15939 and clarifies what in it refers ...
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INFORMATIVENESS AND THE COMPUTATIONAL METROLOGY OF COLLABORATIVE ADAPTIVE SENSOR SYSTEMS
Entanglement is at the heart of quantum technologies such as quantum information and quantum metrology. Providing larger quantum Fisher information (QFI), entangled systems can be better resources than separable systems in quantum metrology. QFI topic is a very active research area and it has many possible usage areas in quantum information domain. In this study, we review quantum Fisher inform...
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