نتایج جستجو برای: scanning probe microscope
تعداد نتایج: 272834 فیلتر نتایج به سال:
We define superconducting constrictions by ploughing a deposited Aluminum film with a scanning probe microscope. The microscope tip is modified by electron beam deposition to form a nano-plough of diamond-like hardness what allows the definition of highly transparent Josephson junctions. Additionally a dc-SQUID is fabricated in order to verify the junctions behaviour. The devices are easily int...
Compressibility of liquid flame spray-deposited porous TiO2 nanoparticle coating was studied on paperboard samples using a traditional calendering technique in which the paperboard is compressed between a metal and polymer roll. Surface superhydrophobicity is lost due to a smoothening effect when the number of successive calendering cycles is increased. Field emission scanning electron microsco...
In the last few years scanning probe microscopy techniques have gained significant importance in a variety of different research fields in science and technology. A rapid development, stimulated by the invention of the scanning tunneling microscope in 1981 and still proceeding at a high pace, has brought about a number of new techniques belonging to this group of surface analytical methods. The...
The use of the scanning electrochemical microscope (SECM) to probe the kinetics of charge-transfer processes at bilayer lipid membranes (BLM) is presented. Analysis of the SECM tip response demonstrates that an unmodified BLM behaves as an insulator, whereas a BLM doped with iodine shows some positive feedback. The SECM technique thus allows one to probe processes at a BLM and determine the kin...
Scanning probe microscopy is a branch of microscopy that forms images of surfaces using a physical probe. This paper is devoted to the control system design for high performance scanning tunneling microscope (STM). The distance between tip and sample should be kept constant at every point of sample for better scanning results. Note that many samples have roughness, curvature and tilt that devia...
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