نتایج جستجو برای: quartz crystal

تعداد نتایج: 168447  

2011
S. C. Power

An introduction and survey is given of some recent work on the infinitesimal dynamics of crystal frameworks, that is, of translationally periodic discrete bond-node structures in R, for d = 2, 3, . . . . We discuss the rigidity matrix, a fundamental object from finite bar-joint framework theory, rigidity operators, matrix-function representations and low energy phonons. These phonons in materia...

2012
A. Klemm A. Banerjee S. Hoernes

During the growth of crystals, different amounts of isotopes are incorporated at the crystallographically differing crystal faces [1-5]. If the temperature and the isotopic composition of the mother solution are constant in time (as could and should be achieved in artificial crystal growth), this interfacial isotope effect and its dependence on temperature can easily be measured. During natural...

Journal: :The Review of scientific instruments 2012
C Stoeckl G Fiksel D Guy C Mileham P M Nilson T C Sangster M J Shoup W Theobald

A narrowband x ray imager for the Cu K(α) line at ~8 keV using a spherically bent quartz crystal has been implemented on the OMEGA EP laser at the University of Rochester. The quartz crystal is cut along the 2131 (211) planes for a 2d spacing of 0.3082 nm, resulting in a Bragg angle of 88.7°, very close to normal incidence. An optical system is used to remotely align the spherical crystal witho...

2009
Vojko Matko Riko Safaric

This paper presents a new method of substantially improving frequency pullability and linearity using reactance in series with an AT fundamental crystal operated with a series load capacitance in the range of 3 to 50 pF and frequencies in the range of 3.5 to 21 MHz. The research describes high quartz pullability and linearity by varying the load capacitance. The paper also gives impedance circu...

2010
P. L. Clay E. F. Baxter D. J. Cherniak S. P. Kelley J. B. Thomas E. B. Watson

The diffusive behavior of argon in quartz was investigated with three analytical depth profiling methods: Rutherford Backscattering Spectroscopy (RBS), 213 nm laser ablation, and 193 nm (Excimer) laser ablation on the same set of experimental samples. The integration of multiple depth profiling methods, each with different spatial resolution and sensitivity, allows for the cross-checking of met...

Journal: :IEICE Transactions 2011
Futao Kaneko Akira Baba Kazunari Shinbo Keizo Kato

In this review, we introduce a variety of surface sensitive techniques for the study of organic thin films, and applications to organic devices. These studies include surface plasmon emission light, organic thin film transistors, combination of quartz crystal microbalance and optical waveguide spectroscopy, evaluation of alignment of liquid crystal molecules at surfaces, and biosensor applicati...

2015
Tetsuya Akitsu Akira Kudo Tomio Sato

Low-frequency double-resonance quartz crystal oscillator circuit was developed with active inductance aiming the quick start-up in the intermittent operation on the sensor circuit and DC isolation using a Q-MEMS sensing crystal HTS-206. Allan standard deviation indicated 5 × 10−12, showing short range stability of the sensor circuit sufficient for the ubiquitous environmental sensor network.

2000
Paul F. Jaeger William H. Smyrl

A method for the detection of in situ corrosion monitoring due to atmospheric gasses has been incorporated to measure not only the amount of corrosion on a copper surface but also the rate of corrosion and a study on the bonding of the adsorbent at the gas solid interface. The Quartz Crystal Microbalance (QCM) has recently been used for this corrosion monitoring. Results indicate a difference i...

2009
B Rubin J. L. Topper A. P. Yalin

We present differential sputter yield measurements of boron nitride due to bombardment by xenon ions. A four-grid ion optics system is used to achieve a collimated ion beam at low energy (<100 eV). A quartz crystal microbalance (QCM) is used to measure differential sputter yield profiles of condensable components from which total sputter yields can also be determined. We report total and differ...

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