نتایج جستجو برای: plasmopara halstedii

تعداد نتایج: 422  

2016
Bertrand Léger Olivier Naud Michel Clerjeau Lionel Delbac

GrapeMilDeWS is an expert-based approach for the integrated pest management (IPM) of two of the major pathogens of grapevine (Vitis vinifera): Erysiphe necator which causes powdery mildew and Plasmopara viticola which causes downy mildew. GrapeMilDeWS has been designed and tested by a team of phytopathologists. It is presented here as a formal model in Statechart. We argue that formal modelling...

Journal: :Molecular plant pathology 2015
Sophien Kamoun Oliver Furzer Jonathan D G Jones Howard S Judelson Gul Shad Ali Ronaldo J D Dalio Sanjoy Guha Roy Leonardo Schena Antonios Zambounis Franck Panabières David Cahill Michelina Ruocco Andreia Figueiredo Xiao-Ren Chen Jon Hulvey Remco Stam Kurt Lamour Mark Gijzen Brett M Tyler Niklaus J Grünwald M Shahid Mukhtar Daniel F A Tomé Mahmut Tör Guido Van Den Ackerveken John McDowell Fouad Daayf William E Fry Hannele Lindqvist-Kreuze Harold J G Meijer Benjamin Petre Jean Ristaino Kentaro Yoshida Paul R J Birch Francine Govers

Oomycetes form a deep lineage of eukaryotic organisms that includes a large number of plant pathogens which threaten natural and managed ecosystems. We undertook a survey to query the community for their ranking of plant-pathogenic oomycete species based on scientific and economic importance. In total, we received 263 votes from 62 scientists in 15 countries for a total of 33 species. The Top 1...

2017
Joana Figueiredo Marisa Maia Marta Sousa Silva Andreia Figueiredo

In grapevine, serine peptidases from the subtilase family were recently associated to Plasmopara viticola resistance. This family in grapevine, first characterized in 2014, was re-analyzed last year and 82 subtilase genes were identified. However, in November of 2016, the National Center for Biotechnology Information database (NCBI) made a new public release of the grapevine genome annotation b...

2016
A. Armigliato R. Balboni A. Benedetti S. Frabboni A. Tixier J. Vanhellemont

The Convergent Beam Electron Diffraction technique (CBED) has been applied to determine the lattice strain in Sii-xGez/Si heterostructures and below patterned films on silicon substrates. The well known problem of the stress relaxation which occurs m thinned TEM samples has been overcome, m the case of the heterostructures, by applying the isotropic elasticity theory to the lattice constants me...

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