نتایج جستجو برای: model error modeling
تعداد نتایج: 2500268 فیلتر نتایج به سال:
modeling and simulation techniques are now widely used alongside with their experimental counterparts in order to complement them, or sometimes to bring first insights into the possible outcome of experiments. “modeling” is a general word that could encompass a wide range of methods that could be applied to a variety of subjects and problems. here, the use of selected molecular modeling methods...
One of the most important problems in regression-based error model is modeling complex representation caused by various corruptions and environment changes images. For example, robust face recognition, images are often affected varying types levels corruptions, such as random pixel block occlusions, or disguises. However, existing works not enough to solve this problem due they cannot corrupted...
Boron (B) is essential to growth at low concentrations and limits growth and yield when in excess. Little is known regarding plant response to excess B and salinity occurring simultaneously. In this study, two models of Leibig-Sprengel (LS) and Mitscherlich-Baule (MB), originally proposed to explain plant response to nutrients only, were modified to evaluate canola yield response to combined le...
Rainfall-runoff models are used in the field of hydrology and runoff estimation for many years, but despite existing numerous models, the regular release of new models shows that there is still not a model that can provide sophisticated estimations with high accuracy and performance. In order to achieve the best results, modeling and identification of factors affecting the output of the model i...
A variety of complex techniques, such as forward error correction (FEC), automatic repeat request (ARQ), hybrid ARQ or cross-layer optimization, require in their design and optimization phase a realistic model of binary error process present in a specific digital channel. Past and more recent modeling approaches focus on capturing one or more stochastic characteristics with precision sufficient...
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