نتایج جستجو برای: mean time between failures

تعداد نتایج: 4474492  

2013
Khaled M. El-Said

ABSTRACT This paper Study the reliability and availability characteristics of the system with PM and CCF. The failure times , replacement times, PM times and CCF times of a components are assumed to be exponentially distributed. We derive the mean time to failure( MTTF) and the steady state availability( ) in this system. Some Special cases have been studies theoretically and graphically to obs...

1998
A. Donaldson

A. Abstract In 1995, an improvement project was completed on the 244 klystron modulators in the linear accelerator. The modulator system has been previously described [ 11. This article offers project details and their resulting effect on modulator and component reliability. Prior to the project, we had collected four operating cycles (1991 through 1995) of MTTF data [2]. In this discussion, th...

2002
PRZEMYSŁAW GRZEGORZEWSKI OLGIERD HRYNIEWICZ

One of the most important problems of reliability analysis is to estimate the mean lifetime of the item under study. In technical applications this parameter is also called the mean time to failure (MTTF) and is often included in the specification of a product. For example, producers are interested whether this time is sufficiently large, as a large MTTF allows them to extend a warranty time. C...

2010
C. Chellappan

In this paper, we present a Markov reward model for the two node active/standby cluster system with multistage assuming minor failures, software rejuvenation and minor repairs. The transient analysis is provided. Some important dependability measures such as availability, reliability and mean time to failure are obtained.

1997
H. Rohringer

One of the architectural concerns in the present design of the Muon Trigger Track Finder (MTTF) is the large number of inputs to the Track Assembler (TA). In the TA block, input track segment pairs from many Extrapolation Units (EU) are associated into tracks. The relative contribution of these inputs to the assembled tracks is studied with simulated track patterns for low and high pt muons ove...

2007
JOSEF BÖRCSÖK EVZUDIN UGLJESA

An advanced safety architecture is the 2 out of 4-system (2oo4). In order to trigger the safety function at least two of the four channels must work correctly. It is said: “A 2oo4-system is 2-failure safe”. In order to classify the quality of a system we calculate different parameters. In the report equations are indicated for PFD for normal and common-cause-failures. Also the Markov-model for ...

2007
Jon MacLaren

HARC—the Highly-Available Resource Co-allocator—is a system for reserving multiple resources in a coordinated fashion. HARC can handle multiple types of resource, and has been used to reserve time on supercomputers distributed across a nationwide testbed in the United States, together with dedicated lightpaths connecting the machines. HARC makes these multiple allocations in a single atomic ste...

2013
Bo Chang

In passenger operation, one often is concerned with on-time performance. On-time performance in commuter operation is measured by the difference between the actual arrival or departure time and scheduled arrival or departure time, respectively. A common practice is to use a time threshold value, and measure the schedule deviation. If the schedule deviation is greater than the set threshold valu...

2007
J. van der Poel C. C. van Waveren

The management of a population of centrifugal pumps in the petrochemical industry can be daunting. A popular method for strategically optimizing the maintenance and operation of these centrifugal pumps is to measure the reliability of the whole pump population in terms of Mean-Time-Between-Failures (MTBF). Too often MTBF improvement becomes the focus rather than a means of supporting the actual...

2015
Bruce M. Paine Steve R. Polmanter Vincent T. Ng Neil T. Kubota Carl R. Ignacio

We describe a conceptually simple technique for estimating the contributions of individual degradation mechanisms to the wearout of RF GaN HEMT. This is important because most “physics of failure” studies on such devices report several distinct mechanisms that operate simultaneously. As a result, the overall degradation rate for a given GaN HEMT technology does not have a well-defined thermal a...

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