Today's integrated circuits with embedding processing capabilities have an ever increasing analog content. While this helps to build richer end applications easily, it significantly complicates the design process. A gamut of heterogeneous analog and digital functional modules must now be integrated across different voltage levels and interfaces. Analog integration and test is hence emerging as ...

Testing complex manufacturing systems, such as an ASML [ASML, 2006] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be executed in what sequence to ensure in the shortest possible test time that the system works, the test sequencing problem, was already solved by Pattipati [Pattipati et al., 1991; Pattipati and Alexandridis, 1990]...

An Investigation of Graph-based Class Integration Test Order Strategies Lionel C. Briand, Yvan Labiche, Yihong Wang Software Quality Engineering Laboratory Carleton University Department of Systems and Computer Engineering 1125 Colonel By Drive Ottawa, ON, K1S 5B6, Canada {briand, labiche, yihong}@sce.carleton.ca ABSTRACT The issue of ordering class integration in the context of integration tes...

A common problem in object-oriented software integration testing is to determine the order in which classes are integrated and tested. In this paper, we first overview some related work based on their objectives in current literature and then provide some analysis and evaluation.

The field reject ratio, the fraction of defective devices that pass the acceptance test, is a measure of the quality of the tested product. Although the assessment of quality is important, a n accurate measurement of the field reject ratio of tested VLSI chips is often not feasible. We show that the known methods of field reject ratio prediction a re not accurate since they fail to realisticall...

Test power is major issue of current scenario of VLSI testing. There are different test pattern generation techniques for testing of combinational circuits. This paper gives a new advancement in automatic test pattern generation method by feeling don’t care bit of the test vector to optimize the switching activities. Finally this concept produces low power testing.

Today’s software quality assurance techniques are often applied in isolation. Consequently, synergies resulting from systematically integrating different quality assurance activities are often not exploited. Such combinations promise benefits, such as a reduction in quality assurance effort or higher defect detection rates. The integration of inspection and testing, for instance, can be used to...

In this paper the authors applied the idea of training multiple tasks simultaneously on a partially shared feed forward network to domain of ontology mapping. A “cross training” mechanism was used to specify corresponding nodes between the two ontologies. By examining output of one network in response to stimulus from the other network, we can test if the network can learn the correspondence th...

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