The Scalable Multiplexed Ion Trap II (SMIT II) program based at Georgia Tech Research Institute (GTRI) was funded by IARPA during the period from August 2008 through July 2010. The overall goal was to design, fabricate and test surface ion traps through a closely correlated, multi-disciplinary approach involving design, simulation, fabrication and test facilities at GTRI and the Nanotechnology ...