To expand the newly developed ARM glasses as reference materials for in situ microanalysis of isotope ratios and iron oxidation state by a variety techniques such SIMS, LA-MC-ICP-MS EPMA, we report Li-B-Si-O-Mg-Sr-Nd-Hf-Pb data Fe2+/?Fe these glasses. The were mainly obtained TIMS, MC-ICP-MS, IR-MS wet-chemistry colorimetric techniques. quality was cross-checked comparing different or results f...

Strong characteristic Kα X-ray lines are accompanied by weak lines due to the radiative Auger effect (RAE) [1, 2]. The characteristic Kα fluorescent X-rays (K-L2,3 lines) are emitted by the 2p→1s electric dipole transition after one of the 1s electron photoionization, Though the probability is less than 0.01, one of the 2p electrons is excited into an unoccupied discrete or continuum level simu...

Here we report on the operation of JEOL JXA-8600SX wavelength-dispersive electron probe microanalyzer (EPMA) after replacing outdated and damaged native computers with popular up-to-date microcomputers (Arduino) a desktop Windows PC. Stepper motors actuating sample stage spectrometers are driven by computerized numerical control (CNC) kits commercialized for hand-made 3D printers, open-source f...

Reducing the measurement uncertainty of quantitative analyses made using electron probe microanalyzers (EPMA) requires a careful study of the individual uncertainties from each definable step of the measurement. Those steps include measuring the incident electron beam current and voltage, knowing the angle between the electron beam and the sample (takeoff angle), collecting the emitted x rays f...