The human Leucine-rich Repeats and WD repeat Domain containing 1 (LRWD1) gene was originally identified by cDNA microarray as one of the genes down-regulated in the testicular tissues of patients with severe spermatogenic defects. Human LRWD1 is a testicular-enriched protein that is present predominantly in the cytoplasm of spermatocytes and spermatids and colocalizes with the centrosome at the...

Fluid shear stress is 1 of the major factors that control gene expression in vascular endothelial cells. We investigated the role of shear stress in the regulation of the expression of fetal liver kinase-1/kinase domain region (Flk-1/KDR), a vascular endothelial growth factor receptor, by using human umbilical vein endothelial cells. Laminar shear stress (15 dyne/cm2) elevated Flk-1/KDR mRNA le...

The Rockefeller University Press $30.00 J. Cell Biol. Vol. 185 No. 5 827–839 www.jcb.org/cgi/doi/10.1083/jcb.200812121 JCB 827 Q. Zhu and L. Meng contributed equally to this work. Correspondence to Robert Y.L. Tsai: [email protected] Abbreviations used in this paper: ALT, alternative lengthening of telomeres; APB, ALT-associated PML body; coIP, coimmunoprecipitation; EMSA, electrophoretic mo...

METHODS. ARPE-19 cells were used as a model to determine the effects of GS on the expression of the ICAM-1 gene upregulated by TNFor IFN, by Western blot analysis and semiquantitative reverse transcription polymerase chain reaction (RT-PCR). The activation and nuclear translocation of the nuclear factors NFB and STAT1 were evaluated by immunocytochemistry, Western blot analysis, and electrophor...

Test Pattern Generators (TPG) are very important logic part of the Circuits that have self-test features. Nowadays, the self-test feature is an in-built part of the modern application hardware designs. This feature enables the user to test and verify the specific hardware failure with the help of the hardware itself. To enable self-test an extra operational and control circuit is required by th...

In recent years, with fast growth of mobile communication and portable computing systems, design for low power has become the challenge in the field of Digital VLSI design. The main focus of the paper is to make a comparative study of low power Linear Feedback Shift Register (LFSR) architecture such as Built In Self Test (BIST), it has been often seen that during test mode process the power con...