grass pea (lathyrus sativus l.) has a high potential for forage production inboth rangelands and cultivated rainfed areas of iran. it is well adapted to semi-arid areas ofwest and north of country where annual rainfall is 250–350 mm. to study the seed and drymatter (dm) yield and agronomic traits, six genotypes of lathyrus sativus l. and twogenotypes of lathyrus inconspicuous l. were provided b...

abstract the critical period of weed control (cpwc) is a period in the crop growth cycle during which weeds must be controlled to prevent yield losses. in order to determine the critical period of weed control (cpwc) of corn in hamedan, an experiment was conducted in 2007 at agricultural research station of bu-ali sina university of hamedan. the experiment was carried out as a randomized comple...

At a Glance: This article describes a prototype of a discrete event simulator-Y4 (Yield Forecaster)-capable of simulating defect related yield loss as a function of time, for a multi-product IC manufacturing line. The methodology of estimating yield and cost is based on mimicking the operation and characteristics of a manufacturing line in the time domain. The effect of particles introduced dur...

We present an arbitrage-free, non-parametric yield curve prediction model which takes the full discretized yield curve data as input state variable. The absence of arbitrage is a particular important model feature for prediction models in case of highly correlated data as, e.g., for interest rates. Furthermore, the model structure allows to separate constructing the daily yield curve from estim...

The measurements of PbWO 4 crystal light yield associated to PIN diode with fast electronics have been made using an electrons and pions beam. Compared to the results obtained using the slow electronics, these new results are lower by a factor 1.5 to 2. The assumption is that this diierence is due to the scintillation slow contribution.

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As integrated circuit fabrication processes continue to increase in complexity, it has been determined that data collection, retention, and retrieval rates will continue to increase at an alarming rate. At future technology nodes, the time required to source manufacturing problems must at least remain constant to maintain anticipated productivity. Strategies and software methods for integrated ...

ion of manufacturing constraints into a set geometric of constraints or design rules for the layout designers to follow have traditionally been foundry’s main method to ensure high probability of correct fabrication of integrated circuits. Typical design rules are constraints on width, spacing or pattern density. Origins of design rules lie various manufacturing steps such as lithography, etch,...