نتایج جستجو برای: آنالیز ebsd

تعداد نتایج: 42641  

2006
M. A. Groeber B. K. Haley D. M. Dimiduk S. Ghosh

A novel methodology is described in this paper which is a step towards three-dimensional representation of grain structures for microstructure characterization and processing microstructural data for subsequent computational analysis. It facilitates evaluation of stereological parameters of grain structures from a series of two-dimensional (2D) electron backscatter diffraction (EBSD) maps. Crys...

2015
Y. Zhang T. D. Topping E. J. Lavernia S. R. Nutt Yuzheng Zhang Steven R. Nutt Enrique J. Lavernia

Tensile tests were performed in situ on an ultrafine-grained (UFG) Al-Mg alloy using a micro-tensile module in a scanning electron microscope (SEM). The micro-strain evolution was tracked and measured using digital image correlation (DIC). A fine random speckle pattern was required to achieve high resolution and accuracy of strain measurement using DIC. To produce the speckle pattern, a pattern...

Journal: :geopersia 2014
aziz rahimi-chakdel

the present study investigates the crystal preferred orientation (cpo) of quartz crystals in psammitic rocks to ascertain the deformationmechanism using electron backscatter diffraction (ebsd) on quartz crystals from north of the renvyle-bofin slide (rbs) nearletterfrack in western ireland. complete crystallographic orientations were determined for several thousand individual quartz crystalsin ...

Journal: :Microscopy and Microanalysis 2002

Journal: :Microscopy and Microanalysis 2003

2006
J. L. Riesterer J. K. Farrer

Despite development of high-resolution [1] and in situ [2] microscopies, grain boundaries remain something of an enigma, especially in ceramic materials where second-phase glass is often found to be present as films or precipitates in the interfacial regions. The glass is an unavoidable product in the liquid-phase sintering (LPS) process and incorporates intentional additives and accidental imp...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2005
Xiaodong Tao Alwyn Eades

Electron back scatter diffraction (EBSD) mapping and indexing has rapidly come into widespread use. However, inadequate attention has been paid to the details of the method. Many of the algorithms in current use were chosen because they were the first ones that were found to work, rather than because they were optimum. Results of systematic study are presented. It is shown that more than one me...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید