We studied the effect of inserting a Ti layer between the Cu and TiN layers on the interconnect resistance and on the resistance toward electromigration (EM) of the damascene interconnects. As a result, it became clear that, by inserting the Ti layer, the adhesion of the Cu to the underlayer could be improved. By inserting the thin Ti layer with atmospheric exposure, we were able to hold down t...

The front transparent conductive oxide layer is a source of significant optical and electrical losses in silicon heterojunction solar cells because of the trade-off between free-carrier absorption and sheet resistance. We demonstrate that hydrogen-doped indium oxide (IO:H), which has an electron mobility of over 100 cm/V s, reduces these losses compared to traditional, low-mobility transparent ...

A comprehensive study was carried out to investigate the critical role played by interface between stopper and bottleneck on oxygen penetration into bottle, as well effect of surface treatment stopper. First, compression micro-agglomerated cork, at close 40% (similar that a cork in still wine bottleneck), had very limited transfer. Second, once inserted glass without any treatment, up 99% total...

In this paper, the linearly conforming enriched radial basis point interpolation method is implemented for the elasto-plastic analysis of discontinuous medium. The linear conformability of the method is satisfied by the application of stabilized nodal integration and the enrichment of radial basis functions is achieved by the addition of linear polynomial terms. To implement the method for the ...

We investigate the origin of transverse cracks often observed in thin films obtained by the layer transfer technique. During this process, two crystals bonded to each other containing a weak plane produced by ion implantation are heated to let a thin layer of one of the material on the other. The level of stress imposed on the film during the heating phase due to the mismatch of thermal expansi...