National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...

Various grinders (diamond and carbide burs, and soflex disks) were used in polishing the composite filling surfaces. Polishing was carried out 10 minutes and 14 days after the material polymerization. The ground surface was then observed by a scanning electron microscope and the surface roughness expressed in [xm. Better surface polish and lower de­ gree of roughness were observed when polishin...

nano films consisting of an alternating sequence of positively and negatively charged polyelectrolytes have been prepared by means of the electrostatic layer-by-layer (lbl) sequential assembly technique on treated and untreated mild steel wires. inhibitor was encapsulated between cationic and anionic polyelectrolyte nano films. this paper mainly focuses on the effect of these nano-films of poly...

The scanning electron microscope (SEM) has been successfully used as an analysis tool for micro scale materials in the last few decades [1]. Recently, the large chamber (LC) SEM at Y-12 has demonstrated useful results in the analysis of large specimens at nano scales. This paper summarizes the research efforts conducted by UT and Y-12 in applying state of art 3D computer vision techniques to LC...

Microstructures of oxide scales thermally formed on single-crystal silicon carbide were investigated using transmission electron microscopy. The oxide scales were formed on the Si-face of 6H-SiC at 1273-1473 K in dry oxygen. Spherical patterns were observed on the surfaces of the oxidized samples by an optical microscope in some regions. In these regions, cross-sectional transmission electron m...

The scanning electron microscope (SEM) has been successfully used as an analysis tool for nano-scale materials in nuclear and special materials applications for many years. Recently, the large chamber (LC) SEM at Y12 has demonstrated its power in surface analysis and inspections of large specimens at the nano-scale without destruction of the specimen. This paper summarizes the research efforts ...

An atomic force microscope (AFM) and spectrometer combined system for in-situ thickness measurement of nano-porous alumina (PA) films is introduced. The AFM is applied to obtain the porosity of PA film, and then we calculate the effective refractive index by Maxwell-Garnett effective dielectric constant theory. The optical thickness of PA film is determined by reflective interference spectromet...

A technique has been developed to examine the same G-banded human metaphase chromosomes, first in the light microscope and then in the scanning electron microscope (SEM). A structural involvement in chromosome banding was confirmed by a positional correlation between the G-positive bands observed in the light microscope and the circumferential grooves between the quaternary coils of the metapha...

nano-sized γ-al2o3 was synthesized successfully by a simple method using al2(so4)3·18h2o as aluminium source and in the presence of polyethylene glycol (peg 2000). ftir spectroscopy, x-ray diffraction (xrd), scanning electron microscope (sem) and transmission electron microscope (tem) were used to characterize the structure and morphology of synthesized powder. the results showed that peg playe...

The effect of grapheme-nanosheets (GNs) on the mechanical properties and microstructure S390 HSS alloy was investigating. sample reinforced with 0.25, 0.5, 0.75 wt.% GNS. Powder metallurgy technique used to prepare all samples. elemental powders were milled in a planetary ball mill by 10:1 powder ratio speed 350 rpm for 48 hours, mixed warm compacted uni-axial press at 550?C under 500 MPa then ...