نتایج جستجو برای: scanning near

تعداد نتایج: 414640  

2009
Jin Sun John C. Schotland Rainer Hillenbrand Scott Carney

microscopy Jin Sun, John C. Schotland, Rainer Hillenbrand, and P. Scott Carney Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA Department of Bioengineering and Graduate Group in Applied Mathematics and Computational Science, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA Nanooptics Laboratory, CIC nanoGUNE Consolider, 200...

Journal: :IEEE Transactions on Electromagnetic Compatibility 2018

2007
Jin Sun P. Scott Carney John C. Schotland Scott Carney

A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this socalled strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

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