نتایج جستجو برای: ray diffraction xrd

تعداد نتایج: 341829  

2012
KAMAL K. TAHA TAGELSIR M. SULEIMAN

Bentonite clay collected from Jabal Umm Ali area NE of Khartoum (Sudan) was characterized by X-ray diffraction (XRD). It was then purified by treatment with distilled water and activated with sulfuric acid at 90 oC for 3.5 hrs. XRD indicated modification of activated bentonite with enhanced surface area. Several cations were removed from octahedral sheet (Mg, Al, and Fe). Increasing the acid co...

2013
Ashok K. Singh Umesh T. Nakate

In the present endeavour, SnO2 nanoparticles (NPs) were synthesized using microwave method. Synthesized SnO2 NPs were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive spectrscopy (EDS) to find their structure, morphology and elemental composition. SnO2 NPs were of spherical morphology having crystallite size of 35.42 nm as obtained from Scher...

2012
Srashti Gupta Vinod Kumar

Bismuth telluride (Bi2Te3) nano particles were prepared by refluxing method in different conditions such as varying concentration of KOH and reaction timings. X-ray diffraction (XRD) and transmission electron microscopy (TEM) measurements have been performed for structural and phase formation studies. The nanoparticles are showing the same structure of bulk except broadening of peak confirmed b...

2007
J. Torrens-Serra P. Bruna J. Rodríguez-Viejo T. Pradell

The devitrification of the Fe65Nb10B25 and Fe70Nb10B20 metallic glasses produced by melt spinning has been studied by calorimetry (DSC), X-ray diffraction (XRD) and transmission Mössbauer spectroscopy (TMS). Calorimetric measurements show three exothermic peaks which have been identified as the successive primary nanocrystallization of mainly a Fe23B6-type phase, the formation of bcc-Fe and met...

2016
T. H. A. Corrêa J. N. F. Holanda

Calcium pyrophosphate (CPP) was prepared by a simple precipitation method using avian eggshell waste as a low-cost alternative calcium precursor source. The synthesized CPP powder was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM/EDS), thermogravimetric analysis (TGA), and Fourier transform infrared spectroscopy (FTIR). The results indicate that pure b-CPP nanocrys...

2006
V. Amendola

Needle-like ZnO nanostructures were synthesized by an organic-free hydrothermal process. Thehydrothermal synthesis was performed at very low pressure (~20 kPa) with duration of process only 10min. The products were characterized by X-ray powder diffraction (XRD)and transmission electronmicroscopy (TEM).The XRD pattern indicated that the needle –like ZnO nanostructures were hexag...

2015
Lakshmi Narayana Sung-Ok Baek Hugo F. Lopez

A chelating agent, 4-benzyloxybenzaldehyde-4-methyl-3-thiosemicarbazone (BBMTSC), containing sulphur and nitrogen donor atoms was synthesized and applied as a ligand for the chelation of Cd(II). Both the BBMTSC and its Cd(II) complex were characterized by elemental analysis, UV-Vis absorption spectra, Fourier transform infrared spectroscopy (FT-IR), mass spectra, nuclear magnetic resonance spec...

2013
Harish Kumar Poonam Sangwan

The thrust to develop eco-friendly procedures for the production of nanoparticles arises from the extremely recent nanotechnology research. MnO2 nanoparticles were synthesized by co-precipitation method using green chemistry. The size, structure and morphology of MnO2 nanoparticles were characterized by UV-Visible, X-Ray diffraction (XRD), FTIR techniques. The average particle size of manganese...

Journal: :Physical review letters 2006
K Lorenz N Franco E Alves I M Watson R W Martin K P O'Donnell

Monte Carlo simulations of anomalous ion channeling in near-lattice-matched AlInN/GaN bilayers allow an accurate determination of the strain state of AlInN by Rutherford backscattering or channeling. Although these strain estimates agree well with x-ray diffraction (XRD) results, XRD composition estimates are shown to have limited accuracy, due to a possible deviation from Vegard's law, which w...

2009
Stephanie Parker

Silicon samples sputtered with multiple magnetic layers can be characterized by using x-ray diffraction (XRD), vibrating sample magnetometry (VSM), and magneto-optical Kerr effect (MOKE) techniques. XRD identifies the crystallographic structures and chemical composition of the unknown layers. VSM measures the change in magnetic moment versus applied field, thus giving the information needed to ...

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