نتایج جستجو برای: mttf

تعداد نتایج: 210  

2015
JAMAL KRINI OSSMANE KRINI

The reliability of software is one of the most important software metrics. In the course of time, systems have become more and more complex and that is why software has become more complex, too. It is an undeniable fact that this will lead to an increasing number of software faults. Models of software reliability are used to track down software faults. The aim is to make sure that an improvemen...

Journal: :IEEE Access 2023

Neuromorphic computing uses spiking neuron network models to solve machine learning problems in a more energy-efficient way when compared conventional artificial neural networks. However, mapping the various components neuromorphic hardware is not trivial realize desired model for an actual simulation. Moreover, neurons and synapses could be affected by noise due external interference or random...

2014
Hu Xiaojing

The strong coupling of software and physical processes in the emerging field motivates the development of new methods to respond to dependability in both the cyber and physical domains. Two kinds of definitions of Cyber-Physical System (CPS) from the view of resource, service and process is proposed at first. In addition, the dependable Model of Cyber-Physical Home Control System is presented b...

2007
Amir Azaron Hideki Katagiri Kosuke Kato Masatoshi Sakawa

Abstract. A new methodology for the reliability optimization of a k dissimilar-unit nonrepairable cold-standby redundant system is introduced in this paper. Each unit is composed of a number of independent components with generalized Erlang distributions of lifetimes arranged in a series-parallel configuration. We also propose an approximate technique to extend the model to the general types of...

2008
J. Van de Casteele M. Bettiati F. Laruelle V. Cargemel P. Pagnod-Rossiaux P. Garabedian L. Raymond D. Laffitte S. Fromy

We demonstrate very high reliability level on 980-1060nm high-power single-mode lasers through multi-cell tests. First, we show how our chip design and technology enables high reliability levels. Then, we aged 758 devices during 9500 hours among 6 cells with high current (0.8A-1.2A) and high submount temperature (65°C-105°C) for the reliability demonstration. Sudden catastrophic failure is the ...

2000
Saeed Mohammadi Dimitris Pavlidis Burhan Bayraktaroglu

Self-aligned AlGaAs/GaAs single heterojunction bipolar transistors (HBT’s) were fabricated using an advanced processing technology for microwave and millimeter-wave power applications. These devices were processed simultaneously, on different epilayers with similar layer structure design supplied from different vendors. They showed similar dc characteristics (current gain, = 30) and their micro...

Journal: :Energies 2021

With increasing deployment of offshore wind farms further from shore and in deeper waters, the efficient effective planning operation maintenance (O&M) activities has received considerable attention energy developers operators recent years. The O&M is a complicated task, as it depends on many factors such asset degradation rates, availability resources required to perform tasks (e.g., t...

Journal: :Electronics 2022

Three-dimensional network-on-chip (NoC) is the primary interconnection method for 3D-stacked multicore processors due to their excellent scalability and interconnect flexibility. With support of 3D NoC, non-uniform cache architecture (NUCA) commonly used organize last-level (LLC) its high capacity fast access latency. However, owing layered structure that leads longer heat dissipation paths var...

Journal: :Ad hoc networks 2022

The unprecedented scale and ubiquity of the Internet Things (IoT) introduce a maintainability challenge. IoT networks operate in diverse harsh environments that impose thermal stress on devices. lifetime these can be limited by hardware failures resulting from exacerbated reliability degradation mechanisms at high temperatures. In this paper, we propose novel adaptive distributed reliability-aw...

2004
Rachna Asthana Taru Garg

Some spans b are always very critical in any network. These spans may be; i) Most heavily loaded spans in the network, ii) Spans with small MTTF (mean time to failure), iii) Spans with high MTTR (mean time to repair), iv) Spans having large amount of premium traffic etc. In this paper a new scheme is proposed to provide protection to these critical spans using p-cycles. Fully distributed method...

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