The focus of this work is on Statistical Process Control (SPC) a manufacturing process based available measurements. Two important applications SPC in industrial settings are fault detection and diagnosis (FDD). In work, deep learning (DL) methodology proposed for FDD. We investigate the application an explainability concept (explainable artificial intelligence (XAI)) to enhance FDD accuracy ne...

Variational quantum algorithms dominate gate-based applications of modern processors. The so-called layerwise trainability conjecture appears in various works throughout the variational computing literature. asserts that a circuit can be trained piecewise, e.g., few layers sequence to minimize an objective function. Here, we prove this false. Counterexamples are found by considering functions e...