Here we examine the detectability of collisionless dark matter candidates that may constitute not all but only a subdominant component of galactic cold dark matter. We show that current axion searches are not suited for a subdominant component, while direct WIMP searches would not be severely affected by the reduced density. In fact, the direct detection rates of neutralinos stay almost constan...

In the dark, the ventral photoreceptor of Limulus exhibits time-variant currents under voltage-clamp conditions; that is, if the membrane potential of the cell is clamped to a depolarized value there is an initial large outward current which slowly declines to a steady level. The current-voltage relation of the cell in the dark is nonlinear. The only ion tested which has any effect on the curre...

Context. Astrophysical observations must be corrected for their imperfections of instrumental origin. When charge-coupled devices (CCDs) are used, their dark signal is one such hindrance. In their pristine state, most CCD pixels are cool, that is, they exhibit a low quasi-uniform dark current, which can be estimated and corrected for. In space, after having been hit by an energetic particle, pi...

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The output current of a n avalanche photodiode (APD) fluctuates in the absence of light a s well a s in its presence. The noise in this current arises from three sources: randomness in the number and in the positions at which dark carrier pairs a r e generated, randomness in the photon arrival number, and randomness in the carrier multiplication process. The volume dark current in many multilay...

The current delivered by the photodiode in a self-mixing frequency modulated continuous wave or optical frequency domain reflectometry system consists of a dc-current resulting from the local oscillator, the reflected signal, dark current in the photodiode, and current generated from background light. The current also contains the useful harmonic signal with a beat frequency corresponding to th...

We analyze the degradation of multi-crystalline silicon photovoltaic modules undergoing simultaneous thermal, mechanical, and humidity-freeze stress testing to develop a dark environmental chamber in-situ measurement procedure for determining module power loss. We analyze dark I-V curves measured on modules undergoing degradation in three steps; first for shunting and recombination losses; seco...

Igor Shcherback Alexander Belenky Orly Yadid-Pecht, MEMBER SPIE Ben Gurion University The VLSI Systems Center P.O.B. 653 Beer-Sheva 84105, Israel Abstract. We present an empirical dark current model for CMOS active pixel sensors (APSs). The model is based on experimental data taken of a 256 3 256 APS chip fabricated via HP in a standard 0.5-mm CMOS technology process. This quantitative model de...