This paper presents a system capable of ECG signal compression and storage based on the theoretical principles of compressed sensing. The main characteristics that stood behind the design were low size, low power consumption and good performance in terms of data compression.

In this paper, an uncertain state filling method is proposed, which can not only effectively reduce the scan shifting power consumption, but also test time simultaneously for test. This based on threshold algorithm of filling, both weighted transitions metric (WTM) and improve compression efficiency vectors. Experiments with ISCAS’89 benchmark circuits show that proposed make a good tradeoff be...

A power efficient System-on-a-Chip test data compressionmethod using alternating statistical run-length coding is proposed. To effectively reduce test power dissipation, the test set is firstly preprocessed by 2D reordering scheme. To further improve the compression ratio, 4 m partitioning of the runs and a smart filling of the don’t care bits provide the nice results, and alternating statistic...

This paper describes a power amplifier, employing parallel-connected laterally diffused metal–oxide semiconductor (LDMOS) devices with optimized channel widths and bias offsets to approximate ideal square-law behavior of the overall transconductance in class-AB operation. The proposed method results in a significant linearity improvement over a large dynamic range in comparison to a conventiona...

We demonstrate a scheme for nonlinear pulse compression at high average powers based on self-phase modulation in a multi-pass cell using fused silica as the nonlinear medium. The scheme is suitable for compression of pulses with peak powers exceeding the threshold for critical self-focusing. At >400  W of input power, the pulses of a Yb:YAG-Innoslab laser system (10 MHz repetition rate, 850 fs ...

The ever-increasing test data volume and test power consumption are the two major issues in testing of digital integrated circuits. This paper presents an efficient technique to reduce test data volume and test power simultaneously. The pre-generated test sets are divided into two groups based on the number of unspecified bits in each test set. Test compression procedure is applied only to the ...