Co-Zn ferrite and BaM ferrite films were deposited on silicon wafer disks with thermally oxidized surface layer without annealing process, and their readlwrite characteristics in contact mode have been investigated by using a MIG and Mn-Zn ferrite head with gap length of 0.2-0.4 pm. The highest linear recording density D50 of Co-Zn ferrite and Ba ferrite films were 105 and 190 WRPI, respectivel...