Scanning tunneling microscopy (STM), Auger electron spectroscopy (AES) and low energy electron diffraction have been used to follow the growth of Si films on Ag(111) at various temperatures. Using a simple growth model, we have simulated the distribution of film thickness as a function of coverage during evaporation, for the different temperatures. In the temperature regime where multilayer sil...

This paper reviews work done of the influence of non-ideal surface topography on electron spectral intensities of surface-sensitive electron spectroscopic methods: primarily X-ray induced photoelectron spectroscopy (XPS) and concise Auger electron spectroscopy (AES), electron energy loss spectroscopy in the reflection mode (REELS), and elastic peak electron spectroscopy (EPES). Several attempts...

Solid-state Auger-electron angular distributions are known to be largely independent of the type of excitation, following roughly a cosine law for low ejection energies. In this Letter it is shown that the ion-track dynamics and the corresponding high electron temperatures lead to significant variations of these Auger distributions. Ratios for different degrees of inner-shell ionization versus ...

Surface reconstructions occurring on the (0001) surface of wurtzite GaN are studied using scanning tunneling microscopy, electron diffraction, and Auger electron spectroscopy. The family of reconstructions found on this face includes 2×2, 5×5, 6×4, and “1×1”, in order of increasing surface Ga/ N ratio. Detailed experimental results are presented for each of these reconstructions. First-principl...