نتایج جستجو برای: atomic force microscope afm

تعداد نتایج: 302535  

2015
Rui Li Hongfei Ye Weisheng Zhang Guojun Ma Yewang Su

Spring constant calibration of the atomic force microscope (AFM) cantilever is of fundamental importance for quantifying the force between the AFM cantilever tip and the sample. The calibration within the framework of thin plate theory undoubtedly has a higher accuracy and broader scope than that within the well-established beam theory. However, thin plate theory-based accurate analytic determi...

Journal: :Nanotechnology 2010
Wei-Chiao Lai Shu-Cheng Chin Yuan-Chih Chang Li-Ying Chen Chia-Seng Chang

In this study, we demonstrate a high-resolution friction profiling technique using synchronous atomic/lateral force microscopy (AFM/LFM). The atomic resolution is achieved by our special carbon nanotube (CNT) probes made via in situ tailoring and manipulation inside an ultra-high vacuum transmission electron microscope (UHV TEM). The frictional pattern mapped on graphite displays a periodic dis...

2007
D. Tranchida S. Piccarolo

The analysis of nanomechanical properties is becoming an increasingly useful tool in a large variety of fields, ranging from biology to polymer science. The Atomic Force Microscope, AFM, can bridge the information about morphology, obtained with outstanding resolution, to local mechanical properties. When performing an AFM nanoindentation, the rough force curve, i.e. the plot of voltage output ...

2011
Feiyue Xing Jiongkun Wang Mingqian Hu Yu Yu Guoliang Chen Jing Liu

A comparative study of immature and mature bone marrow-derived dendritic cells (BMDCs) was first performed through an atomic force microscope (AFM) to clarify differences of their nanostructure and adhesion force. AFM images revealed that the immature BMDCs treated by granulocyte macrophage-colony stimulating factor plus IL-4 mainly appeared round with smooth surface, whereas the mature BMDCs i...

Journal: :Applied physics letters 2015
Ryan Wagner Jason P Killgore

We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric exci...

Journal: :Journal of atherosclerosis and thrombosis 2015
Hiroaki Tobimatsu Yuichiro Nishibuchi Ryo Sudo Shinya Goto Kazuo Tanishita

AIM von Willebrand factor (VWF) plays an important role in the regulation of hemostasis and thrombosis formation, particularly under a high shear rate. However, the adhesive force due to the molecular interaction between VWF and glycoprotein Ibα (GPIbα) has not been fully explored. Thus, we employed atomic force microscopy to directly measure the adhesive force between VWF and GPIbα. METHODS ...

Journal: :Ultramicroscopy 2009
J Lievonen M Ahlskog

Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube...

Journal: :Ultramicroscopy 2011
D Cheneler J Bowen S J Leigh C P Purssell D R Billson D A Hutchins M C L Ward

In this paper a new method of fabricating cylindrical resin microcantilevers using the Direct Digital Manufacturing (DDM) technique of Micro-stereolithography (MSL) is described. The method is rapid and commercially viable, allowing the fabrication of atomic force microscope (AFM) cantilevers which exhibit much larger spring constants than those currently commercial available. This allows for e...

2008
Ayhan Yurtsever Robert W. Stark Wolfgang W. Schmahl

The aim of this work is to develop an experimental method to measure in-plane surface properties on the nanometer scale by torsional resonance mode atomic force microscopy and to understand the underlying system dynamics. The invention of the atomic force microscope (AFM) and the advances in development of new AFM based techniques have significantly enhanced the capability to probe surface prop...

2016
Jae Seol Lee Jungki Song Seong Oh Kim Seokbeom Kim Wooju Lee Joshua A. Jackman Dongchoul Kim Nam-Joon Cho Jungchul Lee

Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe-the key actuating element-has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon...

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