A simple approach was developed to predict corn yields using the MoDerate Resolution Imaging Spectroradiometer (MODIS) data product from two geographically separate major corn crop production regions: Illinois, USA and Heilongjiang, China. The MOD09A1 data, which are eight-day interval surface reflectance data, were obtained from day of the year (DOY) 89 to 337 to calculate the leaf area index ...
