نتایج جستجو برای: x ray film

تعداد نتایج: 745664  

2004
Kevin J. Parker Man Zhang

The field of radiology dates back to 1896 with the first direct x-ray exposure of film by Roentgen. From the next 80 years the exposure of black-and-white film by x-rays, and later, from calculated images from CAT scans, ultrasound scans, and MRI scans would dominate the hardcopy world of medical imaging. The uses of color were largely experimental and limited until the development of real-time...

Journal: :Physical review letters 2012
Surendra Singh M R Fitzsimmons T Lookman J D Thompson H Jeen A Biswas M A Roldan M Varela

We measured the chemical and magnetic depth profiles of a single crystalline (La(1-x)Pr(x))(1-y)Ca(y)MnO(3-δ) (x=0.52±0.05, y=0.23±0.04, δ=0.14±0.10) film grown on a NdGaO(3) substrate using x-ray reflectometry, electron microscopy, electron energy-loss spectroscopy, and polarized neutron reflectometry. Our data indicate that the film exhibits coexistence of different magnetic phases as a funct...

Journal: :journal of nanostructures 2016
s. m. hosseinpour-mashkani a. sobhani-nasab m. maddahfar

this research reports a facile ultrasonic approach for the synthesis of iron vanadate (fevo4) nanoparticles with the aid of ammonium metavanadate (nh4vo3) and fe(no3)3.9h2o as the starting reagents without adding external surfactant, capping agent or template in an aqueous solution. furthermore, to examine the solar cell application of as-synthesized iron vanadate (fevo4) nanoparticles, fto/tio...

2016
Nikita Agarwal

Discovered by Wilhelm Roentgen in 1895, X-ray technology is the oldest and most commonly used form of medical imaging and remains an important tool for the diagnosis of many disorders. X-rays are generated when a beam of electrons is accelerated by high voltage and hits a metal probe. The kinetic energy released is transformed into quanta of emitted X-ray radiation. X-rays are absorbed by the m...

Journal: :Journal of physics. Condensed matter : an Institute of Physics journal 2014
Andrej Furlan Jun Lu Lars Hultman Ulf Jansson Martin Magnuson

The crystal structure and chemical bonding of magnetron-sputtering deposited nickel carbide Ni₁-xCx (0.05 ⩽ x⩽0.62) thin films have been investigated by high-resolution x-ray diffraction, transmission electron microscopy, x-ray photoelectron spectroscopy, Raman spectroscopy, and soft x-ray absorption spectroscopy. By using x-ray as well as electron diffraction, we found carbon-containing hcp-Ni...

Journal: :Analytical and bioanalytical chemistry 2007
W Lisowski E G Keim Z Kaszkur A H J van den Berg M A Smithers

Using a combination of scanning electron microscopy, transmission electron microscopy (TEM), X-ray diffraction and X-ray photoelectron spectroscopy (XPS), we made a comparative study of the high-temperature annealing impact on thin titanium deuteride (TiD(y)) films covered by an ultrathin Pd layer, and on Ti/Pd bilayer films. The bilayer films were prepared under ultrahigh vacuum conditions and...

2000
Hidetaka Arimura Takuji Date Kaoru Morikawa Hideaki Kubota Masao Matsumoto Hitoshi Kanamori

For the optimization of the image quality of radiographs, the effect of the blur due to the scattered x rays on the image signal of radiographs has been ignored. The purpose of this study is to investigate the effect of the scattered x rays on the object sharpness of radiographs for tube voltages of 50 to 100 kV. For the purpose, using a phantom of the polymethyl methacrylate (PMMA) with an alu...

Journal: :Journal of physics. Condensed matter : an Institute of Physics journal 2011
S Gevers T Weisemoeller D Bruns A Giussani T Schroeder J Wollschläger

Thin heteroepitaxial praseodymia films with fluorite structure on Si(111) were annealed under ultra-high vacuum conditions at temperatures in the region of 100 up to 300 °C. Afterward investigations by x-ray diffraction, grazing incidence x-ray diffraction and x-ray reflectometry were performed to obtain information about structural changes of the film during the annealing process. For this rea...

Journal: :Japanese Journal of Radiological Technology 1972

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