نتایج جستجو برای: vision metrology

تعداد نتایج: 132285  

2004
James C. Wyant

The measurement accuracy of an interferometric optical test is generally limited by the environment. This paper discusses two single-shot interferometric techniques for reducing the sensitivity of an optical test to vibration; simultaneous phase-shifting interferometry and spatial carrier interferometry. ©2004 Optical Society of America OCIS codes: (120.0120) Instrumentation, measurement and me...

1993
Theodore H. Hopp

Coordinate measuring systems (CMSs) assess length-based characteristics of mechanical parts by measuring points on the part surface and analyzing the point data. Data analysis software can contribute significantly to the total measurement error of a CMS. Factors affecting software performance include the choice of analysis method, the quality of the software, and characteristics of the specific...

1997
D J Whitehouse

Some important types of instrumentation for measuring surfaces both past and present are reviewed. Exhaustive lists of instruments and performance are not presented; rather more emphasis is placed on the philosophy of measurement. An attempt is made to classify the surface features and also the function of surfaces as a pre-requisite to measurement. It is revealed that, as the push towards mini...

2008
R. E. Barry T. W. Burgess M. Menon A. Slotwinski R. Sebastian

The plasma facing surfaces in ITER must be aligned to millimeter accuracy with respect to the magnetic flux surfaces to prevent impurity influx into the plasma and to avoid component damage. Checking of in-vessel component alignment during initial assembly, operation, and subsequent maintenance is anticipated. A fully remote metrology system is necessary, particularly since major remote operati...

Journal: :Lecture Notes in Computer Science 2021

The developments in optical metrology and computer vision require more advanced camera models. Their geometric calibration is of essential importance. Usually, low-dimensional models are used, which however often have insufficient accuracy for the respective applications. A sophisticated approach uses generalized model. Here, each pixel described individually by its ray properties. Our efforts ...

Journal: :Physical Review A 2019

Journal: :AVS Quantum Science 2020

Journal: :Nature Photonics 2013

Journal: :Journal of Research of the National Bureau of Standards 1981

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