A broadband electron spin resonance spectrometer is described which operates at frequencies between 4 and 40 GHz and can be used in superconducting magnets. A tunable cylindrical cavity is connected to a vector network analyzer via coaxial cables, and the radiation is fed into the cavity by a coupling loop. No field modulation is employed. Resonance frequencies below 14 GHz are obtained by inse...

A via is experimentally characterized by using highfrequency s-parameter measurements. Test patterns are designed and fabricated by using a package process. They are measured by using VNA (vector network analyzer) up to 25GHz. The parasitic effects due to access lines for on-wafer probing are deembedded. Then modeling the via as two equivalent circuits (Ttype and Pi-type), the circuit model par...

A microwave domain characterization approach is proposed to determine the properties of high quality factor optical resonators. This approach features a very high precision in frequency and aims to acquire a full knowledge of the complex transfer function (amplitude and phase) characterizing an optical resonator using a microwave vector network analyzer. It is able to discriminate between the d...

A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe and a precise impedance tuner built up with a high precision programmable delay line and a variable motor-driven attenuator. Advantages such as simplicity of opera...

This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary ...

This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstr...

This paper discusses design, fabrication, and characterization of a 512 × 512 arrayed waveguide grating router (AWGR) with a channel spacing of 25 GHz. The dimensions of the AWGR is 16 mm × 11 mm and is fabricated on a 250 nm silicon-on-insulator platform. The measured channel crosstalk is approximately −4 dB without any compensation for the phase errors in the arrayed waveguides. The AWGR spec...

Abstract—Vector network analyzer (VNA) is versatile measuring equipment which is primarily used for two-port device S parameters measurements. This paper addresses measurement of capacitor parameters using VNA in broad frequency range. The main attention is focused on the measurement accuracy of capacitors parameters using VNA and proper de-embedding of an experimental setup parasitics to get a...

A method is presented for tomographic imaging using time delay of broad band microwave signals passing through objects of varying electrical properties. Time delay imaging is mathematically equivalent to that of conventional planar X-ray tomography. The experimental setup for transit time tomography consists of a circular table with vertically polarized bi-conic horns as transmitting and receiv...

An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of mea...