نتایج جستجو برای: thin film nanocomposite

تعداد نتایج: 199046  

Journal: :IBM Journal of Research and Development 2011
Stephen Lynd Christensen Brian M. Haines Uday D. Lanke Matthew F. Paige Stephen G. Urquhart

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surf...

2006
Josephine Bea Chang Chenming Hu Josephine B. Chang Amanda Murphy Jason Lee

2016
Agnès Tixier-Mita Satoshi Ihida Bertrand-David Ségard Grant A. Cathcart Takuya Takahashi Hiroyuki Fujita Hiroshi Toshiyoshi

2010
Anton Kapustin Ketan Vyas

We introduce and study a new 3d Topological Field Theory which can be associated to any compact real manifold X. This TFT is analogous to the 2d A-model and reduces to it upon compactification on an interval with suitable boundary conditions. It plays a role in 3d mirror symmetry as well as in the physical approach to the geometric Langlands duality. A similar TFT can be defined in four dimensi...

2007
Pavel Steffan Radimír Vrba

The paper describes new approach of potentiostat for very low sensor current measurements. Recent potentiostats were used as measurement devices which were standalone and sensors were connected by a screened wire. These concepts are inconvenient for the presented very low current measurements. The new approach is based on the potentiostat circuitry integrated on a chip that should be directly c...

2007
D. Ngo X. Feng Y. Huang

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis and co-workers [Huang, Y., Ngo, D., Rosakis, A.J., 2005. Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrat...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه تهران 1387

چکیده ندارد.

Journal: :journal of nanostructures 2013
p. balashabadi z. assadollahi m. ghasemi h. bakhtiari e. jafari-khamse

a cylindrical direct current magnetron sputtering coater with two targets for deposition of multilayer thin films and cermet solar selective surfaces has been constructed. the substrate holder was able to rotate around the target for obtaining the uniform layer and separated multilayer phases. the al/ cu multilayer film was deposited on the glass substrate at the following conditions: working g...

Journal: :Microelectronics Reliability 2002
Adelmo Ortiz-Conde Francisco J. García-Sánchez Juin J. Liou Antonio Cerdeira Magali Estrada Y. Yue

The threshold voltage value, which is the most important electrical parameter in modeling MOSFETs, can be extracted from either measured drain current or capacitance characteristics, using a single or more transistors. Practical circuits based on some of the most common methods are available to automatically and quickly measure the threshold voltage. This article reviews and assesses several of...

Journal: :Chemical communications 2005
Xinchen Wang Jimmy C Yu Chunman Ho Angelo C Mak

A Ag/TiO2 nanocomposite, in which silver nanoparticles are highly dispersed in the uniformly sized pores of a cubic mesoporous TiO2 molecular-sieve film, has been fabricated.

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