background and aims: one of the most common injuries around the world is the traumatic injury of the spine and spinal cord with unknown worldwide situation of traumatic spinal cord injury (tsci) affecting on the effectiveness of preventive policy programs. in addition, because of possibility of making paralysis, the potential injury to the spine could be one of the most important traumas and a ...

we present a female patient with atypical chest pain who was referred to our department for ischemia evaluation. 99mtc-mibi myocardial perfusion scan with dipyridamole stress was performed. sub-diaphragmatic activity in the hepatic tissue and then in the bowel loops caused severe overlap on the inferior wall even on consecutive delayed images. dipyridamole stress was repeated for the patient wi...

a 21 years old woman presented with a history of sle and skin lesions on the arms, trunk, and abdomen. the left gluteal region was ulcerated and painful and occasionally extruded a chalky white material. the patient referred from rheumatology department for osteomyelitis assessment. on physical examination the patient had hard, nontender lesions on the proximal arms, lower abdomen and lower bac...

how to cite this article: eghbalian f, rasuli b, monsef f. frequency, causes, and findings of brain ct scans of neonatal seizure at besat hospital, hamadan, iran. iran j child neurol. 2015 winter;9(1):56-63. abstract objective neonatal seizures are the most common neurological symptoms and often signal an underlying serious neurologic condition. this study determines the frequency of neonatal s...

This paper presents segmented addressable scan (SAS), a test architecture that addresses test data volume, test application time, test power consumption, and tester channel requirements using a hardware overhead of a few gates per scan chain. Using SAS, this paper also presents systematic scan reconfiguration, a test data compression algorithm that is applied to achieve 10× to 40× compression r...

Due to the difficulty of test pattern generation for sequential circuits, several design-for-testability (DFT) approaches have been proposed. An improvement to these current approaches is needed to cater to the requirements of today’s more complicated chips. This paper introduces a new DFT method applicable to high-level description of circuits, which optimally utilizes existing functional elem...