نتایج جستجو برای: ray film

تعداد نتایج: 386512  

2013
Sarp Kaya Daniel Schlesinger Susumu Yamamoto John T. Newberg Hendrik Bluhm Hirohito Ogasawara Tom Kendelewicz Gordon E. Brown Lars G. M. Pettersson Anders Nilsson

The structure of thin-film water on a BaF(2)(111) surface under ambient conditions was studied using x-ray absorption spectroscopy from ambient to supercooled temperatures at relative humidity up to 95%. No hexagonal ice-like structure was observed in spite of the expected templating effect of the lattice-matched (111) surface. The oxygen K-edge x-ray absorption spectrum of liquid thin-film wat...

2003
Hai-Ning Cui Vasco Teixeira

Amorphous Tungsten Oxide (alpha-WO3) film is one of the most studied electrochromic (EC) materials. It can be used as EC layer in EC devices. Electrochromism can be described as reversible change optical properties, by an applied external voltage. Here alpha-WO3 thin films were deposited onto glass and ITO substrates by reactive DC magnetron sputtering for EC application. Growth temperature, ox...

2016
Monir Doudi Nasrin Talebian

Nickel oxide thin film of various preferred orientations was deposited using sol-gel method using solvents including methanol. The resulting film was analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM), contact angle measurement, and ultraviolet spectroscopy (UV-vis). Antibacterial activities of nickel oxide-based film against gram-negative bacteria (Escherichia coli) has...

2016
Hyeonju Lee Xue Zhang Jaeeun Hwang Jaehoon Park

We report on the morphological influence of solution-processed zinc oxide (ZnO) semiconductor films on the electrical characteristics of ZnO thin-film transistors (TFTs). Different film morphologies were produced by controlling the spin-coating condition of a precursor solution, and the ZnO films were analyzed using atomic force microscopy, X-ray diffraction, X-ray photoemission spectroscopy, a...

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2010
M K Mukhopadhyay L B Lurio Z Jiang X Jiao Michael Sprung Curt DeCaro S K Sinha

A method is developed for calculating the small-angle x-ray scattering originating from within the interior of a thin film under grazing incidence illumination. This offers the possibility of using x-ray scattering to probe how the structure of polymers is modified by confinement. When the diffuse scattering from a thin film is measured over a range of incident angles, it is possible to separat...

2017
X. F. Zhang M. Kobayashi

A Cu2ZnSnS4 (CZTS) film with a thickness of approximately 1.5 μm was fabricated on a Mo-coated glass substrate by annealing a CZTS precursor fabricated from nanoparticle ink. The chemical states of the elements in the CZTS thin film in the depth direction were studied to identify the presence of secondary phases, which are detrimental to the performance of solar cells containing CZTS. X-ray dif...

2015
Kai Chen Dieter Lott Florin Radu Fadi Choueikani Edwige Otero Philippe Ohresser

The fundamental important and technologically widely employed exchange bias effect occurs in general in bilayers of magnetic thin films consisting of antiferromagnetic and ferromagnetic layers where the hard magnetization behavior of an antiferromagnetic thin film causes a shift in the magnetization curve of a soft ferromagnetic film. The minimization of the single magnetic grain size to increa...

2007
J. Shirokoff C. K. Young L. C. Brits G. T. Andrews M. C. Ridgway

Cu-implanted SiO2 films on Si 100 have been studied and compared to unimplanted SiO2 on Si 100 using x-ray methods, transmission electron microscopy, Rutherford backscattering, and Brillouin spectroscopy. The x-ray results indicate the preferred orientation of Cu 111 planes parallel to the Si substrate surface without any directional orientation for Cu-implanted SiO2/Si 100 and for Cu-implanted...

A TEOS-GPTMS nano-hybrid thin film was deposited on the polymethyl methacrylate (PMMA) substrate by a sol-gel dip coating method. Morphology, roughness and surface chemical bonding of the thin films were evaluated by X-ray diffraction (XRD), field emission scanning electron microscopy(FE-SEM), atomic force microscopy, and Fourier transform infrared spectroscopy methods, respectively. UV-vis spe...

Naghizadeh, M. Divandari, S. M. A. Boutorabi, S. M. M. Shafiei,

In this work, TiN/TiCN & PN/TiCN multilayer films were deposited by plasma- assisted chemical vapour deposition (PACVD). Plasma nitriding (PN) and TiN intermediate layer prior to coating leads to appropriate hardness gradient and it can greatly improve the mechanical properties of the coating. The composition, crystalline structure and phase of the films were investigated by X-ray d...

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