نتایج جستجو برای: ion implantation

تعداد نتایج: 257694  

Journal: :EPJ Web of Conferences 2016

Journal: :Nature Communications 2014

Journal: :Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2005

2016
A. Harata H. Nishimura Q. Shen T. Tanaka T. Sawada

Surface modification of Si(100) wafers induced by argon-ion implantation (ion energy, 300keV; dose, 10" 10'' atoms/cm2) was investigated using a transient reflecting grating technique. Effects of the implantation on velocity, intensity and onset time of surface acoustic waves (SAW) were discussed accompanying the acoustic anisotropy. SAW velocity dispersion was also examined for one of the ligh...

Journal: :Nanoscale 2012
P Sudhagar K Asokan E Ito Yong Soo Kang

Hierarchical nanostructured titanium dioxide (TiO(2)) clumps were fabricated using electrostatic spray with subsequent nitrogen-ion doping by an ion-implantation technique for improvement of energy conversion efficiency for quantum dot-sensitized solar cells (QDSCs). CdSe quantum dots were directly assembled on the produced N-ion-implanted TiO(2) photoanodes by chemical bath deposition, and the...

2002
S. O. Kucheyev J. S. Williams C. Jagadish J. Zou

Mechanisms of blistering of wurtzite GaN films implanted with H ions are studied. In particular, we report on the influence of the following parameters on the blistering process: ~i! ion energy ~from 20 to 150 keV!, ~ii! ion dose ~up to 1.2310 cm!, ~iii! implantation temperature ~from 2196 to 250 °C!, and ~iv! annealing temperature ~up to 900 °C!. Results show that both the onset of blistering ...

Journal: :Nanotechnology 2015
A Redondo-Cubero K Lorenz E Wendler S Magalhães E Alves D Carvalho T Ben F M Morales R García K P O'Donnell C Wetzel

Ion-induced damage and intermixing was evaluated in InGaN/GaN multi-quantum wells (MQWs) using 35 keV N(+) implantation at room temperature. In situ ion channeling measurements show that damage builds up with a similar trend for In and Ga atoms, with a high threshold for amorphization. The extended defects induced during the implantation, basal and prismatic stacking faults, are uniformly distr...

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