A 3-D simulation of single event effects (SEEs) for domestic Silicon–Germanium heterojunction bipolar transistor (SiGe HBT) in extreme environment is performed with TCAD simulation tools. The influences of environment temperature and linear energy transfer (LET) on SEE are investigated. The combined effects of temperature and LET are also discussed. The results show some interesting phenomena b...

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The single-polysilicon non-self-aligned bipolar transistor in a 0.5-pm BiCMOS technology bas been converted into a double-polysilicon emitter-base self-aligned bipolar transistor with little increase in process complexity. Improved bipolar performance in the form of smaller base resistance and base-collector capacitance, larger knee current, higher peak cutoff frequency, and shorter ECL gate de...

-In this paper, we investigate a new reliability damage mechanism in SiGe Heterojunction Bipolar transistor (HBTs).This study differs from conventional HBT/SiGe device reliability associated with other stress. Since it results from an Electromagnetic field aggression which consists of a new stress methodology. The near-field bench is used to disturb with electromagnetic field the Device Under t...

Transistor bandwidths are approaching terahertz frequencies. Paramount to high speed transistor operation is submicron device scaling. High bandwidths are obtained with heterojunction bipolar transistors by thinning the base and collector layers, increasing emitter current density, decreasing emitter contact resistivity, and reducing the emitter and collector junction widths. In mesa HBTs, mini...

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The results of the X-ray radiation impact on heterojunction SiGe and conventional silicon bipolar transistors are presented. Oxide thickness over the emitter-base junction depletion region determines the radiation hardness of the bipolar transistors. In this article, the estimation of the rate of radiation degradation of electrical parameters for conventional silicon devices and SiGe-transistor...

In this paper, we address the epilayer design of the bipolar transistor using the one-dimensional (1-D) mixed-level simulator MAIDS (microwave active integral device simulator). MAIDS facilitates simulation of the electrical behavior of bipolar (hetero) junction transistors with various doping profiles and under different signal conditions in a realistic circuit environment. MAIDS as implemente...

An efficiency-enhanced fully integrated power amplifier (PA) for wireless local area networks (WLANs) was implemented based on the GaAs heterojunction bipolar transistor (HBT) process. A harmonic tuning network that can absorb parasitic inductance of bonding wires is proposed, which reduces chip significantly. The provides nearly optimum fundamental and second impedances from 5.0 to 5.5GHz. Add...