نتایج جستجو برای: ellipsometry

تعداد نتایج: 2054  

2016
P. Marsik

We present a combined study with time-domain terahertz and conventional far-infrared ellipsometry of the temperature dependent optical response of SrTiO3 thin films (82 and 8.5 nm) that are grown by pulsed-laser deposition on (La0.3Sr0.7)(Al0.65Ta0.35)O3 (LSAT) substrates. We demonstrate that terahertz ellipsometry is very sensitive to the optical response of these thin films, in particular, to...

2015
Junbo Gong Rucheng Dai Zhongping Wang Zengming Zhang

Effective optical constants of Ag thin films are precisely determined with effective thickness simultaneously by using an ellipsometry iterated with transmittance method. Unlike the bulk optical constants in Palik's database the effective optical constants of ultrathin Ag films are found to strongly depend on the thickness. According to the optical data two branches of thickness dispersion of s...

Journal: :Physical review letters 2016
Mathias Schubert

A coordinate-invariant generalization of the Lyddane-Sachs-Teller relation is presented for polar vibrations in materials with monoclinic and triclinic crystal systems. The generalization is derived from an eigendielectric displacement vector summation approach, which is equivalent to the microscopic Born-Huang description of polar lattice vibrations in the harmonic approximation. An expression...

2013
M. Saenger Brian W. Robertson Tino Hofmann R. Billa Eva Schubert Mathias Schubert M. F. Saenger T. Höing B. W. Robertson

We report on the evolution of the polaron and phonon mode properties in amorphous tungsten oxide thin films measured by spectroscopic ellipsometry in the infrared to ultraviolet spectral regions as a function of the intercalated proton density. A parametric physical model dielectric function is presented, which excellently describes the ellipsometry data over a large intercalated charge-density...

Journal: :Optics express 2012
Feng Liu Chris J Lee Juequan Chen Eric Louis Peter J M van der Slot Klaus J Boller Fred Bijkerk

We show that, under the right conditions, one can make highly accurate polarization-based measurements without knowing the absolute polarization state of the probing light field. It is shown that light, passed through a randomly varying birefringent material has a well-defined orbit on the Poincar sphere, which we term a generalized polarization state, that is preserved. Changes to the generali...

Journal: :Applied optics 2003
Aleksandra B Djurisić Chung Yin Kwong Tsz Wai Lau Zheng Tong Liu Hoi Sing Kwok Lillian Sze Man Lam Wai Kin Chan

Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-...

2004
I. R. Hooper J. R. Sambles

In this work a differential ellipsometric method utilizing surface plasmons (SPs) for monitoring refractive index changes, which could be used in chemical and biological sensors, is presented. The method is based upon determining the azimuth of elliptically polarized light reflected from a Kretschmann SP system, resulting from linearly polarized light containing both p and s components incident...

Journal: :Journal of the Optical Society of America 1975

Journal: :Journal of Research of the National Bureau of Standards Section A: Physics and Chemistry 1963

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