Standard control charts are often seriously in error when the distributional form of the observations differs from normality. Recently, control charts have been developed for larger parametric families. A third possibility is to apply a suitable (modified version of a) nonparametric control chart. This paper deals with the question when to switch from the control chart based on normality to a p...

In statistical process monitoring, the CUSUM and EWMA control charts have received considerable attention because of their remarkable ability to detect small sustained shifts. practice, variation shifts are anticipated beforehand in many processes, so focus should be on detecting a moderate large shift. The aforementioned identify minor changes population parameters as out-of-control scenarios;...

The reliability data is getting used to monitor and improve the quality of products or services. Nowadays, most of products or services are the results of processes with dependent stages referred to as multi-stage process. In these processes, the quality characteristics are affected by the quality characteristics in the previous stages, called as cascade property. In some cases, it is not possi...

The cumulative conformance count (CCC) charts are widespread in process monitoring of high-yield manufacturing. Recently, it is found the use of variable sampling interval (VSI) scheme could further enhance the efficiency of the standard CCC charts. The average time to signal (ATS) a shift in defect rate has become traditional measure of efficiency of a chart with the VSI scheme. Determining th...

This paper deals with phase II, univariate, statistical process control when a set of incontrol data is available, and when both the in-control and out-of-control distributions of the process are unknown. Existing process control techniques typically require substantial knowledge about the in-control and out-of-control distributions of the process, which is often difficult to obtain in practice...

This paper deals with phase II, univariate, statistical process control when a set of in-control data is available, and when both the in-control and out-of-control distributions of the process are unknown. Existing process control techniques typically require substantial knowledge about the in-control and out-of-control distributions of the process, which is often difficult to obtain in practic...

Endpoint detection is very important undertaking on the side of getting a good understanding and figuring out if a plasma etching process is done in the right way, especially if the etched area is very small (0.1%). It truly is a crucial part of supplying repeatable effects in every single wafer. When the film being etched has been completely cleared, the endpoint is reached. To ensure the desi...

Control charts are the most important tools of statistical process control used to discriminate between assignable and common causes of variation and to improve the quality of a process. To design a control chart, three parameters including sample size, sampling interval, and control limits should be determined. The objectives are hourly expected cost, in-control average run length, power of th...

The application of protective gel, which is a subprocess of the electronic assembly of the exhaust gas recircula‐ tion sensor, is a highly capable process with the fraction of nonconforming units as low as 200 ppm. Every unit is inspected immediately after gel application. The conven‐ tional Shewhart chart is of no use here, and the ap‐ proach based on the Bernoulli process is therefore conside...