نتایج جستجو برای: transmission electron microscope tem

تعداد نتایج: 567607  

Journal: :The Journal of Cell Biology 1976
B A Silverberg P M Stokes L B Ferstenberg

The results of ultrastructural studies and transmission electron microscope microanalysis of two Scenedesmus strains experimentally exposed to copper sulfate are presented. A fine-structural examination of the cells revealed the presence of nuclear inclusions in the form of central dense-core complexes. Cytoplasmic structures resembling the intranuclear inclusions were occasionally found in the...

2010
Hessam M. Ghassemi Chee Huei Lee Yoke Khin Yap Reza S. Yassar

Using a novel in-situ scanning tunneling microscope integrated into a 200kV transmission electron microscope (TEM), we have shown that boron nitride nanotubes (BNNTs) possess remarkable flexibility and convert from insulator to semi-conductor upon bending. To measure the electrical properties, the BNNT was bent between two gold contacts constructing a metal-semiconductor-metal circuit. The resi...

2013
F. Tabatabaie A. Mortazavi

In this study we investigated the effect of heat shock (42-45°C for 5, 10, 15, 20, 25, 30 minutes) cold shock (4, 0, -5, -10 and -20°C for 2h) on cell wall Microstructure of LAB. Cell wall Changes and micro -damage behavior of LAB under the impact of heat and cold shock was studied by optical microscope and Transmission Electron Microscope (TEM). Treatment of LAB with heat and cold shock had si...

Journal: :Micron 2008
Fabián Pérez-Willard Daniel Wolde-Giorgis Talaát Al-Kassab Gabriel A López Eric J Mittemeijer Reiner Kirchheim Dagmar Gerthsen

Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a two-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph...

2004
K. N. Chen A. Fan R. Reif

The microstructure morphologies of copper bonded wafers were examined by means of transmission electron microscopy (TEM) and atomic force microscope (AFM). Morphologies of non-distinct, zigzag and distinct interfaces in the bonded layer are observed. A strong relationship between the roughness of surfaces and the individual steps in bonding initiation was found. We propose three different mecha...

2013
Liqiang Wang Zhengjie Lin Xueting Wang Qiwei Shi Weiqing Yin Di Zhang Zhongtang Liu Weijie Lu

This work aims to clarify the influence of aging temperature and time on the microstructure and mechanical properties of the Ti­Nb alloy for biomedical applications. The ingot of Ti­27Nb­2Ta­3Zr alloy was subjected to the arc melting, hot-forging and heat treatment respectively. Microstructure characterization was investigated by optical microscope (OM), X-ray diffraction (XRD), scanning electr...

2005
Jinshan Yu Junliang Liu Jinxu Zhang Jiansheng Wu

In order to investigate the structure of Fe–Zn phase in a commercial galvannealed IF steel sheet, the electron diffraction and composition of phase in a commercial galvannealed IF steel sheet were studied by transmission electron microscope (TEM) and X-ray energy dispersive spectroscopy (EDX). The cross-sectional TEM specimen was prepared using focused ion beam (FIB) technique which was also in...

2017
Jing Guo Sha Liu Yefei Zhou Jibo Wang Xiaolei Xing Xuejun Ren

The stability of the eutectic carbide in a self-designed Fe-Cr-Mo-W-V-C alloy during solidifi atio as a alyzed i this ork. The ar ide pre ipitatio rule of the steel was calculated by Thermo-Calc.The typical microstructures at 1240 °C and 1200 °C ere o ser ed y opti al i ros ope OM ,field e issio s a i g ele tro microscope (FESEM) and transmission electron microscope (TEM). The selected area dif...

Journal: :Nanoscale 2014
Georg Haberfehlner Angelina Orthacker Mihaela Albu Jiehua Li Gerald Kothleitner

Extending the capabilities of electron tomography with advanced imaging techniques and novel data processing methods, can augment the information content in three-dimensional (3D) reconstructions from projections taken in the transmission electron microscope (TEM). In this work we present the application of simultaneous electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectr...

Journal: :ACS nano 2009
Tolou Shokuhfar Ganesh K Arumugam Patricia A Heiden Reza S Yassar Craig Friedrich

The mechanical compressive properties of individual thin-wall and thick-wall TiO(2) nanotubes were directly measured for the first time. Nanotubes with outside diameters of 75 and 110 nm and wall thicknesses of 5 and 15 nm, respectively, were axially compressed inside a 400 keV high-resolution transmission electron microscope (TEM) using a new fully integrated TEM-atomic force microscope (AFM) ...

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