We report tapping mode microwave impedance imaging based on atomic force microscope platforms. The shielded cantilever probe is critical to localize the tip-sample interaction near the tip apex. The modulated tip-sample impedance can be accurately simulated by the finite-element analysis and the result agrees quantitatively to the experimental data on a series of thin-film dielectric samples. T...

Using the quasistatic Tomlinson model as a simple representation of an atomic force microscope, conditions for transitions in atomic-scale friction behavior from smooth sliding to single slips and then multiple slip regimes are derived based on energy minimization. The calculations predict and give a general explanation for transitions between different stick-slip regimes in the limit of low da...

This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wi...

We perform direct local-field imaging of a plasmon-resonant gold nanoparticle pair separated by a gap of several nanometers using a scattering-type near-field optical microscope with a sharp silicon tip of atomic force microscope. The sharp tip allows the access for the nanogap and the high spatial resolution. Our results provide experimental evidence that the nanogap structure produces an opti...

In recent years, considerable attention has focused on biological applications of the atomic force microscope (AFM), in particular on high-resolution imaging of individual biological molecules and on the measurement of molecular forces under near-physiological conditions. The detection of intermolecular forces in the piconewton range has paved the way to investigate details on structural parame...

We developed an in-plane Atomic Force Microscope (AFM) probe that is specifically tailored to the needs of biological applications. It features a variable stiffness, which makes the stiffness of the probe adjustable to the surface hardness of the sample [1]. The inherent capability of the in-plane AFM probe for building a massively parallel array is also an important feature that greatly affect...

We have performed the most realistic simulation to date of the operation of a scanning tunneling microscope. Probe-sample distances from beyond tunneling to actual surface contact are covered. We simultaneously calculate forces, atomic displacements, and tunneling currents, allowing quantitative comparison with experimental values. A distance regime below which the probe becomes unstable is ide...

The quest for nonoptical imaging methods that can surmount light diffraction limits resulted in the development of scanning probe microscopes. However, most of the existing methods are not quite suitable for studying biological samples. The scanning ion conductance microscope (SICM) bridges the gap between the resolution capabilities of atomic force microscope and scanning electron microscope a...

In order to increase the imaging speed of a scanning probe microscope in tapping mode, we propose to use a dynamic controller on 'parachuting' regions. Furthermore, we propose to use variable scan speed on 'upward step' regions, with the speed determined by the error signal of the closed-loop control. We offer line traces obtained on a calibration grating with 25-nm step height, using both stan...

Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a two-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph...