We present results on terahertz (THz) spectroscopy on epitaxial vanadium dioxide (VO(2)) films grown on sapphire across the metal-insulator transition. X-ray diffraction indicates the VO(2) film is highly oriented with the crystallographic relationship: (002)(film)//(0006)(sub) and [010](film)//[2 ̅1 ̅10](sub). THz studies measuring the change in transmission as a function of temperature demonstr...

Using high-brilliance high-energy synchrotron X-ray radiation, for the first time the total scattering of a thin organic glass film deposited on a strongly scattering inorganic substrate has been measured in transmission mode. The organic thin film was composed of the weakly scattering pharmaceutical substance indomethacin in the amorphous state. The film was 130 µm thick atop a borosilicate gl...

Specular X-ray reflectivity (XR) and quartz crystal microbalance (QCM) measurements were used to determine the absorption of water into thin poly(4-ammonium styrenesulfonic acid) films from saturated vapor at 25 degrees C. The effect of film thickness on the absorption kinetics and overall absorption was investigated in the range of thickness from (3 to 200) nm. The equilibrium swelling of all ...

Thin films of tin oxide were deposited by electron beam evaporation. The effects of the sensor biasing voltage and film thickness on the CO-sensing of tin oxide thin films were investigated. The films were characterized using X-ray diffraction and X-ray photoelectron spectroscopy All the films were found to be amorphous. The current-voltage characteristic of the sensor in air has shown that sem...

In this contribution we demonstrate a method of synthesizing a hexagonal boron nitride (h-BN) thin film by ambient pressure chemical vapor deposition on polycrystalline Ni films. Depending on the growth conditions, the thickness of the obtained h-BN film is between ∼5 and 50 nm. The h-BN grows continuously on the entire Ni surface and the region with uniform thickness can be up to 20 μm in late...

Fluorine-doped tin oxide (FTO) films were deposited on float glass to create low-emissivity glass (low-E glass) by atmospheric pressure chemical vapor deposition (APCVD). Heat treatments were carried out to assess its antioxidant properties. The surface morphology, crystal structure, and the oxygen and tin concentrations in the FTO films were investigated by scanning electron microscope (SEM), ...

A novel sol–gel process suitable for depositing thin-film lead barium titanate has been developed. X-ray diffraction analysis showed perovskite phase crystallization to occur at a temperature as low as 400°C with single-phase Pb0.5Ba0.5TiO3 (PBT) resulting at a temperature as low as 500°C. Small concentrations of barium carbonate were evident by X-ray diffraction at 400°C, and indications of mi...

Thin films of silver selenide have been prepared by chemical bath deposition technique at substrate temperature of 300K. The films were characterized by X-ray diffraction and UV-VIS spectrophotometer. Silver selenide thin films are polycrystalline with orthorhombic structure, confirmed by x-ray diffractogram. The deposition parameters were optimized to obtain good quality thin films. The film d...

This paper reports on a Ga2O3–Cu2O composite thin film that allows the destruction of both Gram negative and Gram positive bacteria via a dual mechanism involving Ga ions that disrupt Femetabolism pathways in bacteria as well as through the reactive oxygen species generated by possible Fenton type reactions that are mediated by Cu ions. This dual mechanism allowed the highly transparent composi...

We present a titanium-silicon oxide film structure that permits polarization modulated infrared reflection absorption spectroscopy on silicon oxide surfaces. The structure consists of a ~6 nm sputtered silicon oxide film on a ~200 nm sputtered titanium film. Characterization using conventional and scanning transmission electron microscopy, electron energy loss spectroscopy, X-ray photoelectron ...