نتایج جستجو برای: metrology

تعداد نتایج: 4764  

Journal: :Metrology 2023

Our journal ‘Metrology’ has been up and running for a few years now, with interesting ground-breaking publications covering the wide field that concept of ‘metrology’ encompasses [...]

2013
Wolfgang Osten Marc Wilke Giancarlo Pedrini

The idea of remote laboratories is reviewed, and the potential of the approach on selected examples with special focus on the field of optical metrology is illustrated. The concept of remote metrology is extended beyond the simple exchange of data between distant laboratories and the remote access to experimental facilities embedded in modern educational concepts. We describe an architecture th...

2013
Zbigniew Czaja Bogdan Bartosinski

1 Gdansk University of Technology, Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics, ul. G. Narutowicza 11/12, 80-233 Gdansk, Poland, phone 48 58 347-14-87, fax 48 58 347-13-57, e-mail [email protected] 2 Gdansk University of Technology, Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics,...

2006
James K. Olthoff

This paper provides a very brief overview of the capabilities and recent accomplishments of many of the low frequency electrical metrology projects at the National Institute of Standards and Technology. The projects presented here include the 5 main electrical measurement services projects (dc voltage, resistance, impedance, ac-dc difference, and electric power) and some electrical metrology re...

Journal: :Applied optics 2016
Dustin B Moore James R Fienup

For optical metrology by transverse translation diversity phase retrieval (or ptychography), information theoretic limits on the ability to estimate subaperture translation, essential for accurate metrology, are assessed as a function of the optical aberrations of the system being measured. Special attention is given to the case that an unknown linear phase aberration, or equivalent detector or...

2007
Marko Jurčević

− A growing number of measurements in commercial and industrial sector need to refer to the traceability to the national (and international) standards. Instrument and reference standards calibration is resource and time consuming. Since many of the available digital instruments provide some communication interfaces and the internet-enabled metrology is rapidly developing in the recent years, it...

2004
Ralf K Heilmann Carl G Chen Mark L Schattenburg

Metrology is the science and engineering of measurement. It has played a crucial role in the industrial revolution at the milli-inch length scale and in the semiconductor revolution at the micrometre length scale. It is often proclaimed that we are standing at the threshold of another industrial revolution, brought by the advent and maturing of nanotechnology. We argue that for nanotechnology t...

2016
David Flater Paul E. Black Elizabeth Fong Raghu Kacker Vadim Okun Stephen Wood D. Richard Kuhn

Much software research and practice involves ostensible measurements of software, yet little progress has been made on a metrological foundation like the International System of Units (SI) for those measurements since the work of Gray, Hogan, et al. in 1996–2001. Given a physical object, one can determine physical properties using measurement principles and express measured values using standar...

2009
Robert Schmitt Niels König Guilherme Francisco Mallmann Frank Depiereux

 The quality inspection of products poses a challenge towards existing production metrology techniques in terms of accuracy and speed, especially when it comes to inline or in-process measurements. In this terms, optical metrology proves its capabilities, in particular for sensible and fragile work pieces. For the inspection inside small spaces and cavities or for complex geometries, many opti...

2017
Shengshi Pang Andrew N. Jordan

Quantum metrology has been studied for a wide range of systems with time-independent Hamiltonians. For systems with time-dependent Hamiltonians, however, due to the complexity of dynamics, little has been known about quantum metrology. Here we investigate quantum metrology with time-dependent Hamiltonians to bridge this gap. We obtain the optimal quantum Fisher information for parameters in tim...

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