نتایج جستجو برای: integrated systems

تعداد نتایج: 1397570  

Journal: :The Japanese Journal of Rehabilitation Medicine 2018

Journal: :International Journal of Imaging Systems and Technology 2004

Journal: :Journal of Geographical Systems 1999

Journal: :Annals of "Spiru Haret". Economic Series 2014

2006
Günther Schuh Alexander Sauer Sebastian Döring

Joining collaborations and maintaining relationships within these has become a major concern for managers in industrial companies. This change to a large extent arises due to the globalisation of markets and the ongoing specialisation of companies, fostered by the possibilities of information technology and datacommunication. However, such a structural change requires adaptations by companies t...

2005

Catching the Wave, Joseph Bower and Clayton Christensen observe that, for a technology to be disruptive, it must climb a steep performance trajectory for attributes already valued by customers (1). The disruptive technology, in a short period of time, outperforms its predecessors – enabling profound advancements in science and industry. The term disruptive may well describe integrated fluidic c...

2012
RYAN T. CRAGUN BARRY KOSMIN ARIELA KEYSAR JOSEPH H. HAMMER

The present study examines perceived discrimination faced by religious ‘nones’. After distinguishing between atheists, agnostics, and ‘nones’ who are deists or theists, we use nationally representative data from the 2008 American Religious Identification Survey (ARIS) to study the contexts in which these various types of religious ‘nones’ have reported experiencing discrimination. The strongest...

Journal: :Philosophical transactions. Series A, Mathematical, physical, and engineering sciences 2012
Robert-H Munnig Schmidt

The developments in lithographic tools for the production of an integrated circuit (IC) are ruled by 'Moore's Law': the density of components on an IC doubles in about every two years. The corresponding size reduction of the smallest detail in an IC entails several technological breakthroughs. The wafer scanner, the exposure system that defines those details, is the determining factor in these ...

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