نتایج جستجو برای: fix ended deep beam
تعداد نتایج: 352668 فیلتر نتایج به سال:
Modern Radars use phased array antenna for higher directive gains. These array antennas can be used to form a beam in the desired direction also known as beam steering, if there is any jammer present then it cannot be suppressed by just beamforming or beam steering, in such case we need to use Adaptive antenna. Adaptive antennas use the smart signal processing algorithms also known as adaptive ...
The experiments have been performed at five different beam energies around the Coulomb barrier (6.09 to 7.35×A MeV). The spectrometer was covering scattering angles of 35°±7°, corresponding to 56°−84° and 96°−124° in the centre of mass frame. For beam energies beyond 6.9×A MeV we found a broad bump in the mass region 190<A<230 which originates from deep inelastic and quasi-fission products. The...
AIM To investigate whether routine formalin fixation of all brains coming to necropsy increases the rate of detection of brain abnormalities relative to either selective formalin fixation of brain tissue or fresh dissection of all brain tissue at the time of post mortem examination. METHODS A retrospective study of 300 medicolegal necropsies was performed. One hundred cases were examined by d...
One option for enabling mobility between 5G nodes is to use a set of area-fixed reference beams in the downlink direction from each node. To save power these reference beams should be turned on only on demand, i.e. only if a mobile needs it. An User Equipment (UE) moving out of a beam’s coverage will require a switch from one beam to another, preferably without having to turn on all possible be...
BACKGROUND AND PURPOSE The dose due to secondary neutrons and photons in proton therapy was estimated with Monte Carlo simulations. Three existing facilities treating eye and deep-seated tumours were taken into account. The results of the calculations related to eye proton therapy were verified with measurements. MATERIALS AND METHODS The simulations were performed with the FLUKA code. Neutro...
In this article, we explore the application of Scanning Capacitance Microscopy (SCM) for studying focused ion beam (FIB) induced damage in silicon. We qualitatively determine the technologically important beam shape by measuring the SCM image of FIB processed implantation spots and by comparison of topographical and SCM data. Further, we investigate the question how deep impinging ions generate...
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