Abstract Metrological atomic force microscopes (Met. AFMs) with built-in interferometers are one of the main workhorses for versatile dimensional nanometrology. The interferometric nonlinearity error, particularly high-order (i.e., 3rd- and 4th-order) errors, is a dominant error source further improving their metrology performance, which cannot be corrected using conventional Heydemann correcti...

A number of non-standard finite element methods have been proposed in recent years, each which derives from a specific class PDE-constrained norm minimization problems. The most notable examples are LL? methods. In this work, we argue that all high-order should be expected to deliver substandard uniform h-refinement convergence rates. fact, one may not even see rates proportional the polynomial...

OBJECTIVE To examine the effect of interruptions and task complexity on error rates when prescribing with computerized provider order entry (CPOE) systems, and to categorize the types of prescribing errors. DESIGN Two within-subject factors: task complexity (complex vs simple) and interruption (interruption vs no interruption). Thirty-two hospital doctors used a CPOE system in a computer labo...