The main advantage of wavelength-dispersive spectrometers applied in X-ray study is their high energy resolution. design and construction spectrometer, usually dedicated to the specific experimental systems, for example synchrotron based setups, need information about characteristics elements spectrometer such as optics elements, crystals detectors. Such can be obtained using Monte-Carlo simula...

In the present work, gamma-ray linear attenuation coefficients (µ) and transmission factors (TF) were measured for Erzurum Ispir dry bean (IDB) Ankara Kızılcahamam (KDB). Photons of Am-241 point source with an energy 59.54 keV, Energy Dispersive X-Ray Fluorescence Spectrometer (EDXRFS), a Si (Li) detector used in experiment. As result, it was observed that average factor İspir dried beans highe...

In this paper, electrodeposition and visible light photocurrent responses of Zn-doped Cu2O were reported. The process was conducted with different deposition time to study the growth deposit. structural investigation elemental analysis performed on an energy dispersive X-ray spectrometer diffractometer, respectively. crystal studied from micrograph obtained using a field emission scanning elect...

Toxoplasmosis is an important zoonosis in public health because domestic cats are the main agents responsible for the transmission of this disease in Brazil. We investigate a method for diagnosing toxoplasmosis based on Raman spectroscopy. Dispersive near-infrared Raman spectra are used to quantify anti-Toxoplasma gondii (IgG) antibodies in blood sera from domestic cats. An 830-nm laser is used...

Most existing slit spectrometers disperse light into spatially separated spectral components and then record this spectral information on a photodetector (PD), normally in the form of an array. We propose an alternative system and method that allow for a small and reversible spatial overlap or multiplexing of image spectral components on individual pixels of a PD array. The spectral components ...

The microstructures, phase compositions, and high-temperature oxidation behavior of a NiCrAlY coating fabricated by arc ion plating were investigated scanning electron microscopy (SEM), energy dispersive spectrometer (EDS), atomic force microscope (AFM), X-ray diffractometer (XRD). results indicate that the was covered protective Al2O3 scale with excellent resistance after at 1050 °C for 100 h;...

Electron-excited X-ray microanalysis performed in the scanning electron microscope with energy-dispersive X-ray spectrometry (EDS) is a core technique for characterization of the microstructure of materials. The recent advances in EDS performance with the silicon drift detector (SDD) enable accuracy and precision equivalent to that of the high spectral resolution wavelength-dispersive spectrome...