A method to perform diagnostic test generation in sequential circuits by modifying a conventional test generator is presented. The method utilizes circuit netlist modification along with a forced value at a primary input in the modified circuit. Techniques to reduce the computational effort for diagnostic test pattern generation in sequential circuits are also presented. Speed-up of the diagnos...

In development processes with high code production ratestesting typically triggers fault diagnosis to localize the de-tected failures. However, current test prioritization algo-rithms are tuned for failure detection rate rather than di-agnostic information. Consequently, unnecessary diagnosticeffort might be spent to localize the faults. We present adynamic test prioriti...

Diagnostic Test for Acute Cerebral Ischemia To the Editor: We read with interest the article recently published by Lynch JR et al.1 The authors report that the knowledge of 1 marker of glial activation (S100 ), 2 markers of inflammation (matrix metalloproteinase [MMP]-9 and vascular adhesion molecule [VCAM]) and 1 marker of thrombosis (von Willebrand factor [vWF]) in the first 6 hours can help ...