This paper presents a new low power BIST TPG scheme for reducing scan transitions. It uses a transition freezing and melting method which is implemented of the transition freezing block and a MUX. When random test patterns are generated from an LFSR, transitions of those patterns satisfy pseudo-random Gaussian distribution. The proposed technique freezes transitions of patterns using a freezing...

At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost high-quality self-test methodologies that can be used by processors to test themselves at-speed. Currently, built-in self-test (BIST) is the primary self-test methodology available. While memory BIST is commonly used for testing embedded...

We present X-tolerant deterministic BIST (XDBIST), a novel method to efficiently compress and apply scan patterns generated by automatic test pattern generation (ATPG) in a logic built-in self-test architecture. Our method allows test patterns to have any number of unknown values with no degradation in compression and application efficiency. XDBIST does not require changing the core logic of th...

Chemically assembled electronic nanotechnology (CAEN) is under intense investigation as a possible alternative or complement to CMOS-based computing. CAEN is a form of molecular electronics that uses directed selfassembly and self-alignment to construct electronic circuits from nanometer-scale devices that exploit quantummechanical effects. Although expected to have densities greater than 10 ga...

Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...